In situ RHEED and XPS studies of epitaxial thin α-Fe₂O₃(0001) films on sapphire

Engineering & Materials Science

• Reflection high energy electron diffraction 100%
• Sapphire 64%
• Monolayers 63%
• X ray photoelectron spectroscopy 59%
• Aluminum oxide 15%
• Core levels 12%
• Binding energy 12%
• Molecular beam epitaxy 12%
• Lattice constants 12%
• Corundum 11%
• Ions 7%
• Oxygen 6%
• Satellites 6%
• Substrates 5%

Physics & Astronomy

• sapphire 41%
• contraction 30%
• ferric ions 24%
• statistical distributions 17%
• binding energy 13%
• aluminum oxides 13%
• deviation 11%
• shift 9%
• oxygen 9%

Chemical Compounds

• Monolayer 36%
• Liquid Film 23%
• Madelung Potential 13%
• Core Level 9%
• Lattice Constant 9%
• Binding Energy 7%
• Hexagonal Space Group 6%
• Dioxygen 3%
• Ion 3%
• Surface 2%