In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire

Tatsuo Fujii, D. Alders, F. C. Voogt, T. Hibma, B. T. Thole, G. A. Sawatzky

Research output: Contribution to journalArticle

68 Citations (Scopus)

Abstract

In situ RHEED and XPS measurements of epitaxial α-Fe2O3(0001) films are reported as a function of the number of deposited monolayers. The films were prepared on α-Al2O3(0001) substrates by MBE. The RHEED patterns suggest that layer-by-layer growth of α-Fe2O3(0001) occurs for the first few monolayers. Subsequently, the growth mode changes to three-dimensional growth. The in-plane lattice constant of the first monolayer of α-Fe2O3(0001) is expanded relative to that of the bulk, although in the case of lattice matching between α-Al2O3 and α-Fe2O3 a contraction would be expected. This can be explained by assuming a basic hexagonal structure for the first monolayer with a random distribution of ferric ions over the octahedral sites between the close-packed oxygen layers. Beyond the first monolayer, the ordered corundum structure is formed. The lineshapes of the XPS Fe 2p core level spectra are also found to be thickness-dependent. The deviation of the Madelung potential at the surface shifts the positions of the Fe 2p peaks to lower binding energies. For the first few monolayers, the satellite intensity is reduced because the interplanar contraction leads to a shorter Fe-O distance.

Original languageEnglish
Pages (from-to)579-586
Number of pages8
JournalSurface Science
Volume366
Issue number3
DOIs
Publication statusPublished - Nov 1 1996
Externally publishedYes

Fingerprint

Reflection high energy electron diffraction
Aluminum Oxide
Sapphire
Monolayers
sapphire
X ray photoelectron spectroscopy
contraction
ferric ions
statistical distributions
aluminum oxides
binding energy
deviation
Corundum
Core levels
shift
oxygen
Binding energy
Molecular beam epitaxy
Lattice constants
Satellites

Keywords

  • Epitaxy
  • Iron oxide
  • Molecular beam epitaxy
  • Reflection high-energy electron diffraction (RHEED)
  • X-ray photoelectron spectroscopy (XPS)

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Condensed Matter Physics
  • Surfaces and Interfaces

Cite this

Fujii, T., Alders, D., Voogt, F. C., Hibma, T., Thole, B. T., & Sawatzky, G. A. (1996). In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire. Surface Science, 366(3), 579-586. https://doi.org/10.1016/0039-6028(96)00844-8

In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire. / Fujii, Tatsuo; Alders, D.; Voogt, F. C.; Hibma, T.; Thole, B. T.; Sawatzky, G. A.

In: Surface Science, Vol. 366, No. 3, 01.11.1996, p. 579-586.

Research output: Contribution to journalArticle

Fujii, T, Alders, D, Voogt, FC, Hibma, T, Thole, BT & Sawatzky, GA 1996, 'In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire', Surface Science, vol. 366, no. 3, pp. 579-586. https://doi.org/10.1016/0039-6028(96)00844-8
Fujii, Tatsuo ; Alders, D. ; Voogt, F. C. ; Hibma, T. ; Thole, B. T. ; Sawatzky, G. A. / In situ RHEED and XPS studies of epitaxial thin α-Fe2O3(0001) films on sapphire. In: Surface Science. 1996 ; Vol. 366, No. 3. pp. 579-586.
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