In situ positioning of a few hundred micrometer-sized cleaved surfaces for soft-x-ray angle-resolved photoemission spectroscopy by use of an optical microscope

Takayuki Muro, Yukako Kato, Tomohiro Matsushita, Toyohiko Kinoshita, Yoshio Watanabe, Akira Sekiyama, Hiroshi Sugiyama, Masato Kimura, Satoshi Komori, Shigemasa Suga, Hiroyuki Okazaki, Takayoshi Yokoya

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Physics & Astronomy

Engineering & Materials Science