In situ photoemission study of LaNiO3 thin films grown by pulsed laser deposition

K. Horiba; R. Eguchi; M. Taguchi; A. Chainani; A. Kikkawa; Y. Senba; H. Ohashi; S. Shin

doi:10.1016/j.elspec.2006.12.048

In situ photoemission study of LaNiO₃ thin films grown by pulsed laser deposition

K. Horiba, R. Eguchi, M. Taguchi, A. Chainani, A. Kikkawa, Y. Senba, H. Ohashi, S. Shin

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

We investigate the electronic structure of high-quality single-crystal LaNiO₃(LNO) thin films using in situ photoemission spectroscopy (PES) in order to reveal the intrinsic electronic structure of LNO. The O 1s X-ray absorption (XAS) spectrum, which have much deeper probing depth than that of PES measurement, is in good agreement with previous studies on polycrystalline LNO surfaces. The in situ valence band PES spectrum shows well-resolved Ni 3d-derived t_2g and e_g features, while earlier X-ray photoemission studies on polycrystals showed a single band peak. The narrow e_g-derived feature exhibits enhanced intensity compared to local density approximation band structure calculations. The results are consistent with a renormalization of electronic states at E_F, in terms of the known enhanced effective mass.

Original language	English
Pages (from-to)	107-110
Number of pages	4
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	156-158
DOIs	https://doi.org/10.1016/j.elspec.2006.12.048
Publication status	Published - May 1 2007
Externally published	Yes

Keywords

In situ photoemission spectroscopy
LaNiO thin film
Pulsed laser deposition

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

Access to Document

10.1016/j.elspec.2006.12.048

Cite this

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title = "In situ photoemission study of LaNiO3 thin films grown by pulsed laser deposition",

abstract = "We investigate the electronic structure of high-quality single-crystal LaNiO3(LNO) thin films using in situ photoemission spectroscopy (PES) in order to reveal the intrinsic electronic structure of LNO. The O 1s X-ray absorption (XAS) spectrum, which have much deeper probing depth than that of PES measurement, is in good agreement with previous studies on polycrystalline LNO surfaces. The in situ valence band PES spectrum shows well-resolved Ni 3d-derived t2g and eg features, while earlier X-ray photoemission studies on polycrystals showed a single band peak. The narrow eg-derived feature exhibits enhanced intensity compared to local density approximation band structure calculations. The results are consistent with a renormalization of electronic states at EF, in terms of the known enhanced effective mass.",

keywords = "In situ photoemission spectroscopy, LaNiO thin film, Pulsed laser deposition",

author = "K. Horiba and R. Eguchi and M. Taguchi and A. Chainani and A. Kikkawa and Y. Senba and H. Ohashi and S. Shin",

year = "2007",

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doi = "10.1016/j.elspec.2006.12.048",

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T1 - In situ photoemission study of LaNiO3 thin films grown by pulsed laser deposition

AU - Horiba, K.

AU - Eguchi, R.

AU - Taguchi, M.

AU - Chainani, A.

AU - Kikkawa, A.

AU - Senba, Y.

AU - Ohashi, H.

AU - Shin, S.

PY - 2007/5/1

Y1 - 2007/5/1

N2 - We investigate the electronic structure of high-quality single-crystal LaNiO3(LNO) thin films using in situ photoemission spectroscopy (PES) in order to reveal the intrinsic electronic structure of LNO. The O 1s X-ray absorption (XAS) spectrum, which have much deeper probing depth than that of PES measurement, is in good agreement with previous studies on polycrystalline LNO surfaces. The in situ valence band PES spectrum shows well-resolved Ni 3d-derived t2g and eg features, while earlier X-ray photoemission studies on polycrystals showed a single band peak. The narrow eg-derived feature exhibits enhanced intensity compared to local density approximation band structure calculations. The results are consistent with a renormalization of electronic states at EF, in terms of the known enhanced effective mass.

AB - We investigate the electronic structure of high-quality single-crystal LaNiO3(LNO) thin films using in situ photoemission spectroscopy (PES) in order to reveal the intrinsic electronic structure of LNO. The O 1s X-ray absorption (XAS) spectrum, which have much deeper probing depth than that of PES measurement, is in good agreement with previous studies on polycrystalline LNO surfaces. The in situ valence band PES spectrum shows well-resolved Ni 3d-derived t2g and eg features, while earlier X-ray photoemission studies on polycrystals showed a single band peak. The narrow eg-derived feature exhibits enhanced intensity compared to local density approximation band structure calculations. The results are consistent with a renormalization of electronic states at EF, in terms of the known enhanced effective mass.

KW - In situ photoemission spectroscopy

KW - LaNiO thin film

KW - Pulsed laser deposition

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