In situ monitoring of indentation cracking in dielectric ceramics was examined by introducing a semiconducting region in the surface of the ceramics. Titanium dioxide was employed as the dielectric ceramic. The monitoring sensitivity can be enhanced by controlling the thickness of the conducting layer.
|Number of pages||3|
|Journal||Journal of Materials Science Letters|
|Publication status||Published - 2000|
ASJC Scopus subject areas
- Materials Science(all)