In-situ monitoring of indentation fracture in semiconductive titania ceramics utilizing electric conduction

N. Sadotani, S. Hirano, Akira Kishimoto

Research output: Contribution to journalArticle

Abstract

In situ monitoring of indentation cracking in dielectric ceramics was examined by introducing a semiconducting region in the surface of the ceramics. Titanium dioxide was employed as the dielectric ceramic. The monitoring sensitivity can be enhanced by controlling the thickness of the conducting layer.

Original languageEnglish
Pages (from-to)221-223
Number of pages3
JournalJournal of Materials Science Letters
Volume19
Issue number3
DOIs
Publication statusPublished - 2000
Externally publishedYes

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Indentation
Titanium
Monitoring
Titanium dioxide
titanium dioxide

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

In-situ monitoring of indentation fracture in semiconductive titania ceramics utilizing electric conduction. / Sadotani, N.; Hirano, S.; Kishimoto, Akira.

In: Journal of Materials Science Letters, Vol. 19, No. 3, 2000, p. 221-223.

Research output: Contribution to journalArticle

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