Improvement of trace element analysis system using RIKEN electron cyclotron resonance ion source and linear accelerator

M. Kidera, T. Nakagawa, K. Takahashi, S. Enomoto, K. Igarashi, M. Fujimaki, E. Ikezawa, O. Kamigaito, M. Kase, A. Goto, Y. Yano

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We have developed a new analytical system that consists of an electron cyclotron resonance ion source (RIKEN 18 GHz ECRIS) and a RIKEN heavy ion linear accelerator (RILAC). This system is called trace element analysis using electron cyclotron resonance ion source and RILAC (ECRIS-RILAC-TEA). ECRIS-RILAC-TEA has several advantages as described in the work of Kidera [AIP Conf. Proc. 749, 85 (2005)]. However, many experimental results during the last several years revealed a few problems: (1) large background contamination in the ECRIS, particularly at the surface of the plasma chamber wall, (2) high counting of the ionization chamber and the data taking system that is monitored by the direct beam from the accelerator, and (3) difficulty in the selection of the pilot sample and pilot beam production from the ECRIS for the purpose of normalization. In order to overcome these problems, we conducted several test experiments over the past year. In this article, we report the experimental results in detail and future plans for improving this system.

Original languageEnglish
Article number03C302
JournalReview of Scientific Instruments
Volume77
Issue number3
DOIs
Publication statusPublished - Mar 2006
Externally publishedYes

Fingerprint

Linear accelerators
Electron cyclotron resonance
systems analysis
Ion sources
linear accelerators
electron cyclotron resonance
Trace elements
Heavy ions
trace elements
ion sources
heavy ions
accelerators
Ionization chambers
data systems
ionization chambers
Particle accelerators
counting
contamination
Contamination
chambers

ASJC Scopus subject areas

  • Instrumentation
  • Physics and Astronomy (miscellaneous)

Cite this

Kidera, M., Nakagawa, T., Takahashi, K., Enomoto, S., Igarashi, K., Fujimaki, M., ... Yano, Y. (2006). Improvement of trace element analysis system using RIKEN electron cyclotron resonance ion source and linear accelerator. Review of Scientific Instruments, 77(3), [03C302]. https://doi.org/10.1063/1.2173965

Improvement of trace element analysis system using RIKEN electron cyclotron resonance ion source and linear accelerator. / Kidera, M.; Nakagawa, T.; Takahashi, K.; Enomoto, S.; Igarashi, K.; Fujimaki, M.; Ikezawa, E.; Kamigaito, O.; Kase, M.; Goto, A.; Yano, Y.

In: Review of Scientific Instruments, Vol. 77, No. 3, 03C302, 03.2006.

Research output: Contribution to journalArticle

Kidera, M, Nakagawa, T, Takahashi, K, Enomoto, S, Igarashi, K, Fujimaki, M, Ikezawa, E, Kamigaito, O, Kase, M, Goto, A & Yano, Y 2006, 'Improvement of trace element analysis system using RIKEN electron cyclotron resonance ion source and linear accelerator', Review of Scientific Instruments, vol. 77, no. 3, 03C302. https://doi.org/10.1063/1.2173965
Kidera, M. ; Nakagawa, T. ; Takahashi, K. ; Enomoto, S. ; Igarashi, K. ; Fujimaki, M. ; Ikezawa, E. ; Kamigaito, O. ; Kase, M. ; Goto, A. ; Yano, Y. / Improvement of trace element analysis system using RIKEN electron cyclotron resonance ion source and linear accelerator. In: Review of Scientific Instruments. 2006 ; Vol. 77, No. 3.
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