Improvement of detectability for CMOS floating gate defects in supply current test

H. Michinishi, Tokumi Yokohira, T. Okamoto, T. Kobayashi, T. Hondo

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We already proposed a supply current test method for detecting floating gate defects in CMOS ICs. In the method, increase of the supply current caused by defects is promoted by superposing a sinusoidal signal on the supply voltage. In this study, we propose one way to improve detectability of the method for the defects. They are detected by analyzing the frequency of supply current and judging whether secondary harmonics of the sinusoidal signal exist or not. Effectiveness of our way is confirmed by some experiments.

Original languageEnglish
Title of host publicationProceedings of the Asian Test Symposium
PublisherIEEE Computer Society
Pages406-409
Number of pages4
Volume2003-January
ISBN (Print)0769519512
DOIs
Publication statusPublished - 2003
Event12th Asian Test Symposium, ATS 2003 - Xi'an, China
Duration: Nov 16 2003Nov 19 2003

Other

Other12th Asian Test Symposium, ATS 2003
CountryChina
CityXi'an
Period11/16/0311/19/03

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Defects
Electric potential
Experiments

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Michinishi, H., Yokohira, T., Okamoto, T., Kobayashi, T., & Hondo, T. (2003). Improvement of detectability for CMOS floating gate defects in supply current test. In Proceedings of the Asian Test Symposium (Vol. 2003-January, pp. 406-409). [1250846] IEEE Computer Society. https://doi.org/10.1109/ATS.2003.1250846

Improvement of detectability for CMOS floating gate defects in supply current test. / Michinishi, H.; Yokohira, Tokumi; Okamoto, T.; Kobayashi, T.; Hondo, T.

Proceedings of the Asian Test Symposium. Vol. 2003-January IEEE Computer Society, 2003. p. 406-409 1250846.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Michinishi, H, Yokohira, T, Okamoto, T, Kobayashi, T & Hondo, T 2003, Improvement of detectability for CMOS floating gate defects in supply current test. in Proceedings of the Asian Test Symposium. vol. 2003-January, 1250846, IEEE Computer Society, pp. 406-409, 12th Asian Test Symposium, ATS 2003, Xi'an, China, 11/16/03. https://doi.org/10.1109/ATS.2003.1250846
Michinishi H, Yokohira T, Okamoto T, Kobayashi T, Hondo T. Improvement of detectability for CMOS floating gate defects in supply current test. In Proceedings of the Asian Test Symposium. Vol. 2003-January. IEEE Computer Society. 2003. p. 406-409. 1250846 https://doi.org/10.1109/ATS.2003.1250846
Michinishi, H. ; Yokohira, Tokumi ; Okamoto, T. ; Kobayashi, T. ; Hondo, T. / Improvement of detectability for CMOS floating gate defects in supply current test. Proceedings of the Asian Test Symposium. Vol. 2003-January IEEE Computer Society, 2003. pp. 406-409
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