Imaging of internal stress around a mineral inclusion in a sapphire crystal: Application of micro-Raman and photoluminescence spectroscopy

Naoki Noguchi, Ahmadjan Abduriyim, Ichiko Shimizu, Nanako Kamegata, Shoko Odake, Hiroyuki Kagi

Research output: Contribution to journalArticle

13 Citations (Scopus)


We developed a micro-Raman and photoluminescence imaging technique for visualizing the internal stress fields in a sapphire crystal. The technique was applied to an Australian sapphire gemstone with a zircon inclusion. Considering piezospectroscopic effects on Raman and photoluminescence spectra, the Raman shifts of sapphire around the zircon inclusion were converted to hydrostatic pressure and deviatoric components of stress tensor. The internal stress was highly concentrated at the tips of the zircon crystal, where the deviatoric stress and the hydrostatic pressure component reached 700 and 470 MPa, respectively. Generation of compressive stress on the crystal surface of zircon can be explained by the difference in thermal expansion coefficients and elastic constants between sapphire and zircon. In general, internal stress fields induced by mineral inclusions reflect the pressure and temperature conditions at which the host sapphire gemstones were crystallized. Thus, the present technique can be utilized to identify the origin of gemstones.

Original languageEnglish
Pages (from-to)147-154
Number of pages8
JournalJournal of Raman Spectroscopy
Issue number1
Publication statusPublished - Jan 1 2013



  • inclusion
  • internal stress
  • micro-Raman spectroscopy
  • photoluminescence spectroscopy
  • sapphire

ASJC Scopus subject areas

  • Materials Science(all)
  • Spectroscopy

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