Identification of Dominant ICs for Electromagnetic Emission by Using Noise Source Amplitude Modulation and Correlation Analysis

Shimpei Yoshino, Chiaki Ishida, Kengo Iokibe, Yoshitaka Toyota, Yasuyuki Nogami

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

To identify semiconductor devices that are dominant noise sources at low cost in order to reduce electromagnetic interference (EMI), we propose a method based on a noise source amplitude modulation technique and correlation analysis (NSM-CA). In this study, we applied the NSM-CA method to a printed circuit board (PCB) with multiple integrated circuits (ICs) and identified ICs dominantly contributing to EM emission. The switching currents produced in three of the ICs were modulated in amplitude with three different modulation signals. The noise source amplitude modulation was implemented in an FPGA, mounted on a PCB, by using three pseudorandom binary sequences (PRBSs) as modulation signals. During the modulations, EM emission was measured at frequencies where the emission exceeded the limit of EMI regulation. The temporal variation in the measured emission was correlated with each of the PRBSs. The ranking of the contributions of the ICs to the emission was determined by means of the resultant correlation coefficients. According to the ranking, the dominant ICs to which a combination of EMI reduction techniques should be primarily applied were identified. Moreover, we applied an EMI reduction technique to the dominant ICs and found a larger reduction in emission than when the technique was applied to low priority ICs.

Original languageEnglish
Title of host publicationEMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages439-444
Number of pages6
Volume2018-August
ISBN (Electronic)9781467396974
DOIs
Publication statusPublished - Oct 5 2018
Event2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018 - Amsterdam, Netherlands
Duration: Aug 27 2018Aug 30 2018

Other

Other2018 International Symposium on Electromagnetic Compatibility, EMC Europe 2018
CountryNetherlands
CityAmsterdam
Period8/27/188/30/18

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Keywords

  • correlation analysis
  • determination of noise source
  • EMI
  • noise source amplitude modulation
  • PRBS
  • zero-span measurement

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Yoshino, S., Ishida, C., Iokibe, K., Toyota, Y., & Nogami, Y. (2018). Identification of Dominant ICs for Electromagnetic Emission by Using Noise Source Amplitude Modulation and Correlation Analysis. In EMC Europe 2018 - 2018 International Symposium on Electromagnetic Compatibility (Vol. 2018-August, pp. 439-444). [8485011] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EMCEurope.2018.8485011