TY - GEN
T1 - High total-ionizing-dose tolerance field programmable gate array
AU - Fujimori, Takumi
AU - Watanabe, Minoru
N1 - Funding Information:
This research was partly supported by the Initiatives for Atomic Energy Basic and Generic Strategic Research No. 283101, the Ministry of Education, Science, Sports and Culture, Grant-in-Aid for JSPS Research Fellow, No. 16112063 and Grant-in-Aid for Scientific Research(B), No. 15H02676. The VLSI chip in this study was fabricated in the chip fabrication program of VLSI Design and Education Center (VDEC), the University of Tokyo in collaboration with Rohm Co. Ltd. and Toppan Printing Co. Ltd.
Publisher Copyright:
© 2018 IEEE.
PY - 2018/4/26
Y1 - 2018/4/26
N2 - Recently, radiation-hardened SRAM-based field programmable gate arrays (FPGAs) and radiation-hardened flash-based FPGAs have been used frequently for space systems. The total-ionizing-dose tolerances of such radiation-hardened FPGAs are limited to a 1 Mrad total-ionizing-dose. Therefore, space embedded systems must be surrounded by heavy shielding material. However, if a shield-less space embedded system could be achieved, then rocket launch costs could be decreased. This paper therefore presents a proposal of a new radiation-hardened optically reconfigured gate array exploiting its parallel configuration. The total-ionizing-dose tolerance of the radiation-hardened optically reconfiguration gate array has been measured experimentally as a 406 Mrad total-ionizing-dose using a cobalt 60 gamma radiation source, demonstrating at least 406 times higher radiation tolerance than those of currently available radiation-hardened FPGAs.
AB - Recently, radiation-hardened SRAM-based field programmable gate arrays (FPGAs) and radiation-hardened flash-based FPGAs have been used frequently for space systems. The total-ionizing-dose tolerances of such radiation-hardened FPGAs are limited to a 1 Mrad total-ionizing-dose. Therefore, space embedded systems must be surrounded by heavy shielding material. However, if a shield-less space embedded system could be achieved, then rocket launch costs could be decreased. This paper therefore presents a proposal of a new radiation-hardened optically reconfigured gate array exploiting its parallel configuration. The total-ionizing-dose tolerance of the radiation-hardened optically reconfiguration gate array has been measured experimentally as a 406 Mrad total-ionizing-dose using a cobalt 60 gamma radiation source, demonstrating at least 406 times higher radiation tolerance than those of currently available radiation-hardened FPGAs.
KW - Field programmable gate arrays (FPGAs)
KW - Optically reconflgurable gate arrays (ORGAs)
KW - radiation-hardened FPGAs
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U2 - 10.1109/ISCAS.2018.8351543
DO - 10.1109/ISCAS.2018.8351543
M3 - Conference contribution
AN - SCOPUS:85057127311
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
BT - 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018
Y2 - 27 May 2018 through 30 May 2018
ER -