High resolution X-ray scattering study of the anion ordering phase transition of (TMTSF)2CIO4

Jean Paul Pouget, Seiichi Kagoshima, Tsuyoshi Tamegai, Yoshio Nogami, Yoshio Nogami, Tetsuo Nakajima, Klaus Bechgaard

Research output: Contribution to journalArticle

33 Citations (Scopus)

Abstract

The anions of (TMTSF)2CIO4 order below about 24 K. The speed at which this transition is passed has a drastic influence on the low temperature electronic properties of this salt. We determined as a function of the cooling rate the number of ordered CIO4 as well as the average size of the ordered domains. A high resolution X-ray synchrotron radiation study showed that this transition exhibited very unusual features probably due to the coupling of the anions with angular deformations of the Bravais lattice during the ordering process. We investigated also the kinetics of the Ising order parameter describing the anion ordering by a study of the temporal evolution of a superlattice reflection during thermal annealing of quenched samples.

Original languageEnglish
Pages (from-to)2036-2053
Number of pages18
JournalJournal of the Physical Society of Japan
Volume59
Issue number6
Publication statusPublished - Jun 1990
Externally publishedYes

Fingerprint

anions
high resolution
scattering
x rays
synchrotron radiation
salts
cooling
annealing
kinetics
electronics

Keywords

  • Anion ordering
  • Superlattice reflection
  • Synchrotron radiation
  • Thermal annealing
  • Thermal quenching
  • X-ray scattering

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Pouget, J. P., Kagoshima, S., Tamegai, T., Nogami, Y., Nogami, Y., Nakajima, T., & Bechgaard, K. (1990). High resolution X-ray scattering study of the anion ordering phase transition of (TMTSF)2CIO4. Journal of the Physical Society of Japan, 59(6), 2036-2053.

High resolution X-ray scattering study of the anion ordering phase transition of (TMTSF)2CIO4. / Pouget, Jean Paul; Kagoshima, Seiichi; Tamegai, Tsuyoshi; Nogami, Yoshio; Nogami, Yoshio; Nakajima, Tetsuo; Bechgaard, Klaus.

In: Journal of the Physical Society of Japan, Vol. 59, No. 6, 06.1990, p. 2036-2053.

Research output: Contribution to journalArticle

Pouget, JP, Kagoshima, S, Tamegai, T, Nogami, Y, Nogami, Y, Nakajima, T & Bechgaard, K 1990, 'High resolution X-ray scattering study of the anion ordering phase transition of (TMTSF)2CIO4', Journal of the Physical Society of Japan, vol. 59, no. 6, pp. 2036-2053.
Pouget, Jean Paul ; Kagoshima, Seiichi ; Tamegai, Tsuyoshi ; Nogami, Yoshio ; Nogami, Yoshio ; Nakajima, Tetsuo ; Bechgaard, Klaus. / High resolution X-ray scattering study of the anion ordering phase transition of (TMTSF)2CIO4. In: Journal of the Physical Society of Japan. 1990 ; Vol. 59, No. 6. pp. 2036-2053.
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