High-resolution angle-resolved photoemission study of layered transition-metal dichalcogenides Nb1-xTixXc2 (Xc = S, Se, Te)

T. Sato, H. Komatsu, Kensei Terashima, T. Takahashi, M. Shimakawa, K. Hayashi

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

High-resolution angle-resolved photoemission spectroscopy (ARPES) has been performed on Nb1-xTixXc2 (Xc = S, Se, Te) to elucidate the change in the band structure as a function of x and Xc. We found that spectral intensity near EF of S- and Se-based compounds is remarkably suppressed, suggesting the strong scattering of electrons by the substitution of transition metals. In contrast, Te-based compound shows a clear Fermi edge. We discuss the origin of metal-semiconductor transition in terms of the strength of hybridization between chalcogen p band and transition metal d band.

Original languageEnglish
Pages (from-to)633-637
Number of pages5
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
DOIs
Publication statusPublished - Jun 2005
Externally publishedYes

Fingerprint

Photoemission
Transition metals
Chalcogens
photoelectric emission
transition metals
high resolution
Photoelectron spectroscopy
Band structure
Substitution reactions
Metals
Scattering
Semiconductor materials
metals
Electrons
substitutes
scattering
spectroscopy
electrons

Keywords

  • Photoemission
  • Transition metal dichalcogenides

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Spectroscopy
  • Atomic and Molecular Physics, and Optics
  • Surfaces and Interfaces

Cite this

High-resolution angle-resolved photoemission study of layered transition-metal dichalcogenides Nb1-xTixXc2 (Xc = S, Se, Te). / Sato, T.; Komatsu, H.; Terashima, Kensei; Takahashi, T.; Shimakawa, M.; Hayashi, K.

In: Journal of Electron Spectroscopy and Related Phenomena, Vol. 144-147, 06.2005, p. 633-637.

Research output: Contribution to journalArticle

Sato, T. ; Komatsu, H. ; Terashima, Kensei ; Takahashi, T. ; Shimakawa, M. ; Hayashi, K. / High-resolution angle-resolved photoemission study of layered transition-metal dichalcogenides Nb1-xTixXc2 (Xc = S, Se, Te). In: Journal of Electron Spectroscopy and Related Phenomena. 2005 ; Vol. 144-147. pp. 633-637.
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AU - Hayashi, K.

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