High-resolution angle-resolved photoemission study of CeP: Narrow-band formation of 4f electrons

H. Kumigashira, S. H. Yang, Takayoshi Yokoya, A. Chainani, T. Takahashi, A. Uesawa, T. Suzuki

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

High-resolution angle-resolved photoemission spectroscopy at low temperature has been performed on the low-carrier Kondo material CeP. It was found that the p-f bonding state with a dominant 4f character exhibits a finite-energy dispersion of about 40 meV along the ΓX direction in the Brillouin zone. This implies that 4f electrons in CeP form a narrow band owing to the strong anisotropic p-f and d-f mixing.

Original languageEnglish
JournalPhysical Review B
Volume55
Issue number6
Publication statusPublished - 1997
Externally publishedYes

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Photoemission
Photoelectron spectroscopy
Brillouin zones
narrowband
photoelectric emission
Electrons
high resolution
spectroscopy
electrons
Temperature
energy
Direction compound

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Kumigashira, H., Yang, S. H., Yokoya, T., Chainani, A., Takahashi, T., Uesawa, A., & Suzuki, T. (1997). High-resolution angle-resolved photoemission study of CeP: Narrow-band formation of 4f electrons. Physical Review B, 55(6).

High-resolution angle-resolved photoemission study of CeP : Narrow-band formation of 4f electrons. / Kumigashira, H.; Yang, S. H.; Yokoya, Takayoshi; Chainani, A.; Takahashi, T.; Uesawa, A.; Suzuki, T.

In: Physical Review B, Vol. 55, No. 6, 1997.

Research output: Contribution to journalArticle

Kumigashira, H, Yang, SH, Yokoya, T, Chainani, A, Takahashi, T, Uesawa, A & Suzuki, T 1997, 'High-resolution angle-resolved photoemission study of CeP: Narrow-band formation of 4f electrons', Physical Review B, vol. 55, no. 6.
Kumigashira, H. ; Yang, S. H. ; Yokoya, Takayoshi ; Chainani, A. ; Takahashi, T. ; Uesawa, A. ; Suzuki, T. / High-resolution angle-resolved photoemission study of CeP : Narrow-band formation of 4f electrons. In: Physical Review B. 1997 ; Vol. 55, No. 6.
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