High-resolution and simultaneous measurement along the depth direction using virtual phase conjugation for optical tomography

Yuta Goto; Atsushi Okamoto; Atsushi Shibukawa; Akihisa Tomita; Masanori Takabayashi

doi:10.1109/MOC.2015.7416382

High-resolution and simultaneous measurement along the depth direction using virtual phase conjugation for optical tomography

Yuta Goto, Atsushi Okamoto, Atsushi Shibukawa, Akihisa Tomita, Masanori Takabayashi

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

To improve the measurement speed of optical tomography based on the virtual phase conjugation, a virtual measurement position control technique is proposed. Tomographic images were observed with high depth-resolution and high acquisition rate in the numerical simulations.

Original language	English
Title of host publication	MOC 2015 - Technical Digest of 20th Microoptics Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9784863485433
DOIs	https://doi.org/10.1109/MOC.2015.7416382
Publication status	Published - Feb 23 2016
Externally published	Yes
Event	20th Microoptics Conference, MOC 2015 - Fukuoka, Japan Duration: Oct 25 2015 → Oct 28 2015

Other

Other	20th Microoptics Conference, MOC 2015
Country	Japan
City	Fukuoka
Period	10/25/15 → 10/28/15

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Keywords

Biomedical optical imaging
Lenses
Optical imaging
Optical variables measurement
Phase measurement
Position measurement
Tomography

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electronic, Optical and Magnetic Materials

Cite this

Goto, Y., Okamoto, A., Shibukawa, A., Tomita, A., & Takabayashi, M. (2016). High-resolution and simultaneous measurement along the depth direction using virtual phase conjugation for optical tomography. In MOC 2015 - Technical Digest of 20th Microoptics Conference [7416382] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MOC.2015.7416382

High-resolution and simultaneous measurement along the depth direction using virtual phase conjugation for optical tomography. / Goto, Yuta; Okamoto, Atsushi; Shibukawa, Atsushi; Tomita, Akihisa; Takabayashi, Masanori.

MOC 2015 - Technical Digest of 20th Microoptics Conference. Institute of Electrical and Electronics Engineers Inc., 2016. 7416382.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Goto, Y, Okamoto, A, Shibukawa, A, Tomita, A & Takabayashi, M 2016, High-resolution and simultaneous measurement along the depth direction using virtual phase conjugation for optical tomography. in MOC 2015 - Technical Digest of 20th Microoptics Conference., 7416382, Institute of Electrical and Electronics Engineers Inc., 20th Microoptics Conference, MOC 2015, Fukuoka, Japan, 10/25/15. https://doi.org/10.1109/MOC.2015.7416382

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Access to Document

10.1109/MOC.2015.7416382