High pressure, high resolution synchrotron x-ray powder diffraction with a position-sensitive detector

A. P. Jephcoat, L. W. Finger, D. E. Cox

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    30 Citations (Scopus)


    We report results of high-pressure experiments with a new diamond-anvil cell in a monochromatic, high-resolution x-ray scattering geometry with a linear position-sensitive detector. The experiments make possible the study of factors controlling line widths of diffraction profiles at pressures in the 100 GPa range, and demonstrate the potential for the use of line profile analysis and Rietveld refinement techniques with high-pressure powder diffraction data. Combined data for various materials indicate that relative contributions to linewidths due to particle size, intrinsic material strength, pressure and state of stress in the sample can be resolved. With light rare-gas solids as pressure-transmitting media, measured FWHMs of the order 0.03° 2θ corresponding to resolution Δd/d of 2.5 x 10-3 for 2Δ ~ 10-15° are reported. Formation of a high pressure phase appears to involve growth of submicron domains, judging from substantially broadened diffraction peaks under quasihydrostatic conditions. Detailed analysis of complex, non-quenchable high-pressure phases will likely require annealing techniques such as thermal cycling at pressure.

    Original languageEnglish
    Pages (from-to)667-676
    Number of pages10
    JournalHigh Pressure Research
    Issue number5-6
    Publication statusPublished - May 1 1992


    • Diamond-anvil cell
    • LiNbO3
    • Xe
    • position-sensitive detector
    • pressure-induced phase transitions
    • synchrotron radiation
    • x-ray powder diffraction

    ASJC Scopus subject areas

    • Condensed Matter Physics


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