High precision isotope micro-imaging of materials

Hisayoshi Yurimoto, Kazuhide Nagashima, Takuya Kunihiro

Research output: Contribution to journalArticle

63 Citations (Scopus)

Abstract

Secondary ion mass spectrometry (SIMS) is widely used to identify the isotope ratio of the micro-area of materials. We demonstrate that the precision and spatial resolution of an ion microscope using SIMS coupled with a newly developed solid-state ion imager can be extended to two-dimensional isotope ratio imaging with permil-precision. An isotopic map for oxygen clearly reveals the distribution of 4% enrichment of 16O in spinel particles embedded in melilite from a Ca-Al-rich inclusion of a carbonaceous chondrite. This characterization technique called isotopography thus provides the eyes to see small heterogeneity of isotope abundance in micro-scale. It is likely to find broad application in earth, material, and life science research.

Original languageEnglish
Pages (from-to)793-797
Number of pages5
JournalApplied Surface Science
Volume203-204
DOIs
Publication statusPublished - Jan 15 2003
Externally publishedYes

Fingerprint

isotope ratios
Isotopes
secondary ion mass spectrometry
isotopes
Secondary ion mass spectrometry
Imaging techniques
ion microscopes
Earth sciences
carbonaceous chondrites
life sciences
materials science
Ion microscopes
spinel
spatial resolution
inclusions
solid state
Image sensors
oxygen
Earth (planet)
Ions

Keywords

  • Imaging
  • Ion detector
  • Isotope
  • Meteorite
  • Oxygen
  • SIMS

ASJC Scopus subject areas

  • Physical and Theoretical Chemistry
  • Surfaces, Coatings and Films
  • Condensed Matter Physics

Cite this

High precision isotope micro-imaging of materials. / Yurimoto, Hisayoshi; Nagashima, Kazuhide; Kunihiro, Takuya.

In: Applied Surface Science, Vol. 203-204, 15.01.2003, p. 793-797.

Research output: Contribution to journalArticle

Yurimoto, Hisayoshi ; Nagashima, Kazuhide ; Kunihiro, Takuya. / High precision isotope micro-imaging of materials. In: Applied Surface Science. 2003 ; Vol. 203-204. pp. 793-797.
@article{20e9de57b1024f12bf77ef6f576500ce,
title = "High precision isotope micro-imaging of materials",
abstract = "Secondary ion mass spectrometry (SIMS) is widely used to identify the isotope ratio of the micro-area of materials. We demonstrate that the precision and spatial resolution of an ion microscope using SIMS coupled with a newly developed solid-state ion imager can be extended to two-dimensional isotope ratio imaging with permil-precision. An isotopic map for oxygen clearly reveals the distribution of 4{\%} enrichment of 16O in spinel particles embedded in melilite from a Ca-Al-rich inclusion of a carbonaceous chondrite. This characterization technique called isotopography thus provides the eyes to see small heterogeneity of isotope abundance in micro-scale. It is likely to find broad application in earth, material, and life science research.",
keywords = "Imaging, Ion detector, Isotope, Meteorite, Oxygen, SIMS",
author = "Hisayoshi Yurimoto and Kazuhide Nagashima and Takuya Kunihiro",
year = "2003",
month = "1",
day = "15",
doi = "10.1016/S0169-4332(02)00825-5",
language = "English",
volume = "203-204",
pages = "793--797",
journal = "Applied Surface Science",
issn = "0169-4332",
publisher = "Elsevier",

}

TY - JOUR

T1 - High precision isotope micro-imaging of materials

AU - Yurimoto, Hisayoshi

AU - Nagashima, Kazuhide

AU - Kunihiro, Takuya

PY - 2003/1/15

Y1 - 2003/1/15

N2 - Secondary ion mass spectrometry (SIMS) is widely used to identify the isotope ratio of the micro-area of materials. We demonstrate that the precision and spatial resolution of an ion microscope using SIMS coupled with a newly developed solid-state ion imager can be extended to two-dimensional isotope ratio imaging with permil-precision. An isotopic map for oxygen clearly reveals the distribution of 4% enrichment of 16O in spinel particles embedded in melilite from a Ca-Al-rich inclusion of a carbonaceous chondrite. This characterization technique called isotopography thus provides the eyes to see small heterogeneity of isotope abundance in micro-scale. It is likely to find broad application in earth, material, and life science research.

AB - Secondary ion mass spectrometry (SIMS) is widely used to identify the isotope ratio of the micro-area of materials. We demonstrate that the precision and spatial resolution of an ion microscope using SIMS coupled with a newly developed solid-state ion imager can be extended to two-dimensional isotope ratio imaging with permil-precision. An isotopic map for oxygen clearly reveals the distribution of 4% enrichment of 16O in spinel particles embedded in melilite from a Ca-Al-rich inclusion of a carbonaceous chondrite. This characterization technique called isotopography thus provides the eyes to see small heterogeneity of isotope abundance in micro-scale. It is likely to find broad application in earth, material, and life science research.

KW - Imaging

KW - Ion detector

KW - Isotope

KW - Meteorite

KW - Oxygen

KW - SIMS

UR - http://www.scopus.com/inward/record.url?scp=0037438250&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0037438250&partnerID=8YFLogxK

U2 - 10.1016/S0169-4332(02)00825-5

DO - 10.1016/S0169-4332(02)00825-5

M3 - Article

VL - 203-204

SP - 793

EP - 797

JO - Applied Surface Science

JF - Applied Surface Science

SN - 0169-4332

ER -