High frequency properties of YBCO thin films diagnosed by time-domain terahertz spectroscopy

Toshihiko Kiwa; Masayoshi Tonouchi

doi:10.1016/S0921-4534(01)00695-5

High frequency properties of YBCO thin films diagnosed by time-domain terahertz spectroscopy

Toshihiko Kiwa, Masayoshi Tonouchi

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

We measure the complex conductivity σ and the surface impedance of c-axis oriented 100-nm-thick YBa₂Cu₃O_7-δ (YBCO) thin films deposited on (100)MgO substrates (0.5 mm thick) at frequencies between 0.5 and 1.5 THz, using time-domain terahertz spectroscopy. The real part of σ decreases with increasing frequency and its value is about 2.4×10⁵ (S/m) at 1 THz. The imaginary part of σ increases with increasing frequency and then monotonically decreases at around 750 GHz. The real part of σ of YBCO thin films increased with decreasing temperature and decreases below 60 K. The imaginary part of σ increased with decreasing temperature and the trend is enhanced below 60 K. The surface resistance of YBCO thin film is of the order of 10^-1Ω and increases with increasing temperature. The surface reactance of YBCO thin film is independent of the frequency in this THz region, and its value is less than 10^-3Ω at 40 K.

Original language	English
Pages (from-to)	314-318
Number of pages	5
Journal	Physica C: Superconductivity and its applications
Volume	362
Issue number	1-4
DOIs	https://doi.org/10.1016/S0921-4534(01)00695-5
Publication status	Published - Sep 1 2001
Externally published	Yes

Keywords

Complex conductivity
Surface impedance
Time-domain terahertz spectroscopy
YBCO

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Energy Engineering and Power Technology
Electrical and Electronic Engineering

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title = "High frequency properties of YBCO thin films diagnosed by time-domain terahertz spectroscopy",

abstract = "We measure the complex conductivity σ and the surface impedance of c-axis oriented 100-nm-thick YBa2Cu3O7-δ (YBCO) thin films deposited on (100)MgO substrates (0.5 mm thick) at frequencies between 0.5 and 1.5 THz, using time-domain terahertz spectroscopy. The real part of σ decreases with increasing frequency and its value is about 2.4×105 (S/m) at 1 THz. The imaginary part of σ increases with increasing frequency and then monotonically decreases at around 750 GHz. The real part of σ of YBCO thin films increased with decreasing temperature and decreases below 60 K. The imaginary part of σ increased with decreasing temperature and the trend is enhanced below 60 K. The surface resistance of YBCO thin film is of the order of 10-1Ω and increases with increasing temperature. The surface reactance of YBCO thin film is independent of the frequency in this THz region, and its value is less than 10-3Ω at 40 K.",

keywords = "Complex conductivity, Surface impedance, Time-domain terahertz spectroscopy, YBCO",

author = "Toshihiko Kiwa and Masayoshi Tonouchi",

year = "2001",

month = sep,

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doi = "10.1016/S0921-4534(01)00695-5",

language = "English",

volume = "362",

pages = "314--318",

journal = "Physica C: Superconductivity and its Applications",

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T1 - High frequency properties of YBCO thin films diagnosed by time-domain terahertz spectroscopy

AU - Kiwa, Toshihiko

AU - Tonouchi, Masayoshi

PY - 2001/9/1

Y1 - 2001/9/1

N2 - We measure the complex conductivity σ and the surface impedance of c-axis oriented 100-nm-thick YBa2Cu3O7-δ (YBCO) thin films deposited on (100)MgO substrates (0.5 mm thick) at frequencies between 0.5 and 1.5 THz, using time-domain terahertz spectroscopy. The real part of σ decreases with increasing frequency and its value is about 2.4×105 (S/m) at 1 THz. The imaginary part of σ increases with increasing frequency and then monotonically decreases at around 750 GHz. The real part of σ of YBCO thin films increased with decreasing temperature and decreases below 60 K. The imaginary part of σ increased with decreasing temperature and the trend is enhanced below 60 K. The surface resistance of YBCO thin film is of the order of 10-1Ω and increases with increasing temperature. The surface reactance of YBCO thin film is independent of the frequency in this THz region, and its value is less than 10-3Ω at 40 K.

AB - We measure the complex conductivity σ and the surface impedance of c-axis oriented 100-nm-thick YBa2Cu3O7-δ (YBCO) thin films deposited on (100)MgO substrates (0.5 mm thick) at frequencies between 0.5 and 1.5 THz, using time-domain terahertz spectroscopy. The real part of σ decreases with increasing frequency and its value is about 2.4×105 (S/m) at 1 THz. The imaginary part of σ increases with increasing frequency and then monotonically decreases at around 750 GHz. The real part of σ of YBCO thin films increased with decreasing temperature and decreases below 60 K. The imaginary part of σ increased with decreasing temperature and the trend is enhanced below 60 K. The surface resistance of YBCO thin film is of the order of 10-1Ω and increases with increasing temperature. The surface reactance of YBCO thin film is independent of the frequency in this THz region, and its value is less than 10-3Ω at 40 K.

KW - Complex conductivity

KW - Surface impedance

KW - Time-domain terahertz spectroscopy

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