High frequency properties of YBCO thin films diagnosed by time-domain terahertz spectroscopy

Toshihiko Kiwa, Masayoshi Tonouchi

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We measure the complex conductivity σ and the surface impedance of c-axis oriented 100-nm-thick YBa2Cu3O7-δ (YBCO) thin films deposited on (100)MgO substrates (0.5 mm thick) at frequencies between 0.5 and 1.5 THz, using time-domain terahertz spectroscopy. The real part of σ decreases with increasing frequency and its value is about 2.4×105 (S/m) at 1 THz. The imaginary part of σ increases with increasing frequency and then monotonically decreases at around 750 GHz. The real part of σ of YBCO thin films increased with decreasing temperature and decreases below 60 K. The imaginary part of σ increased with decreasing temperature and the trend is enhanced below 60 K. The surface resistance of YBCO thin film is of the order of 10-1Ω and increases with increasing temperature. The surface reactance of YBCO thin film is independent of the frequency in this THz region, and its value is less than 10-3Ω at 40 K.

Original languageEnglish
Pages (from-to)314-318
Number of pages5
JournalPhysica C: Superconductivity and its applications
Volume362
Issue number1-4
DOIs
Publication statusPublished - Sep 1 2001
Externally publishedYes

Keywords

  • Complex conductivity
  • Surface impedance
  • Time-domain terahertz spectroscopy
  • YBCO

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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