Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy

Tomoharu Tokunaga, Tadashi Kawamoto, Kenta Tanaka, Naohiro Nakamura, Katsuhiro Sasaki, Kotaro Kuroda, Yasuhiko Hayashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The WO3 nanorods were fabricated in environmental transmission electron microscopy (ETEM) by simply heating it in oxygen atmosphere. Altough, WO3 nanorod showed high crystalline, but the stacking fault existed in nanorod. Furthermore, the nanorod was grown on tungsten wire through slit of oxide layer on it.

Original languageEnglish
Title of host publicationProceedings - International NanoElectronics Conference, INEC
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event4th IEEE International Nanoelectronics Conference, INEC 2011 - Tao-Yuan, Taiwan, Province of China
Duration: Jun 21 2011Jun 24 2011

Other

Other4th IEEE International Nanoelectronics Conference, INEC 2011
CountryTaiwan, Province of China
CityTao-Yuan
Period6/21/116/24/11

Fingerprint

Nanorods
Tungsten
Transmission electron microscopy
Oxides
Stacking faults
Wire
Crystalline materials
Heating
Oxygen

Keywords

  • in-situ TEM
  • oxidation
  • tungsten

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Tokunaga, T., Kawamoto, T., Tanaka, K., Nakamura, N., Sasaki, K., Kuroda, K., & Hayashi, Y. (2011). Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy. In Proceedings - International NanoElectronics Conference, INEC [5991617] https://doi.org/10.1109/INEC.2011.5991617

Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy. / Tokunaga, Tomoharu; Kawamoto, Tadashi; Tanaka, Kenta; Nakamura, Naohiro; Sasaki, Katsuhiro; Kuroda, Kotaro; Hayashi, Yasuhiko.

Proceedings - International NanoElectronics Conference, INEC. 2011. 5991617.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Tokunaga, T, Kawamoto, T, Tanaka, K, Nakamura, N, Sasaki, K, Kuroda, K & Hayashi, Y 2011, Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy. in Proceedings - International NanoElectronics Conference, INEC., 5991617, 4th IEEE International Nanoelectronics Conference, INEC 2011, Tao-Yuan, Taiwan, Province of China, 6/21/11. https://doi.org/10.1109/INEC.2011.5991617
Tokunaga T, Kawamoto T, Tanaka K, Nakamura N, Sasaki K, Kuroda K et al. Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy. In Proceedings - International NanoElectronics Conference, INEC. 2011. 5991617 https://doi.org/10.1109/INEC.2011.5991617
Tokunaga, Tomoharu ; Kawamoto, Tadashi ; Tanaka, Kenta ; Nakamura, Naohiro ; Sasaki, Katsuhiro ; Kuroda, Kotaro ; Hayashi, Yasuhiko. / Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy. Proceedings - International NanoElectronics Conference, INEC. 2011.
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