Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy

Tomoharu Tokunaga, Tadashi Kawamoto, Kenta Tanaka, Naohiro Nakamura, Katsuhiro Sasaki, Kotaro Kuroda, Yasuhiko Hayashi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The WO3 nanorods were fabricated in environmental transmission electron microscopy (ETEM) by simply heating it in oxygen atmosphere. Altough, WO3 nanorod showed high crystalline, but the stacking fault existed in nanorod. Furthermore, the nanorod was grown on tungsten wire through slit of oxide layer on it.

Original languageEnglish
Title of host publication4th IEEE International NanoElectronics Conference, INEC 2011
DOIs
Publication statusPublished - Sep 26 2011
Externally publishedYes
Event4th IEEE International Nanoelectronics Conference, INEC 2011 - Tao-Yuan, Taiwan, Province of China
Duration: Jun 21 2011Jun 24 2011

Publication series

NameProceedings - International NanoElectronics Conference, INEC
ISSN (Print)2159-3523

Other

Other4th IEEE International Nanoelectronics Conference, INEC 2011
CountryTaiwan, Province of China
CityTao-Yuan
Period6/21/116/24/11

Keywords

  • in-situ TEM
  • oxidation
  • tungsten

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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  • Cite this

    Tokunaga, T., Kawamoto, T., Tanaka, K., Nakamura, N., Sasaki, K., Kuroda, K., & Hayashi, Y. (2011). Growth and structure analysis of tungsten oxide nanorods using environmental transmission electron microscopy. In 4th IEEE International NanoElectronics Conference, INEC 2011 [5991617] (Proceedings - International NanoElectronics Conference, INEC). https://doi.org/10.1109/INEC.2011.5991617