Abstract
Full wave FD-TD analysis has been carried out for coaxial probe inserted into a waveguide so as to achieve coaxial-waveguide transition. Including cases for probes with large diameter and extension length, equivalent admittances agreed well with corresponding measured results and have been provided as useful data for circuit design. Field concentration which ought to be taken into account for high power application design has been also discussed by field distribution.
| Original language | English |
|---|---|
| Pages | 957-960 |
| Number of pages | 4 |
| Publication status | Published - Dec 1 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1997 Asia-Pacific Microwave Conference, APMC. Part 2 (of 3) - Hong Kong, Hong Kong Duration: Dec 2 1997 → Dec 5 1997 |
Other
| Other | Proceedings of the 1997 Asia-Pacific Microwave Conference, APMC. Part 2 (of 3) |
|---|---|
| City | Hong Kong, Hong Kong |
| Period | 12/2/97 → 12/5/97 |
ASJC Scopus subject areas
- Engineering(all)
Fingerprint Dive into the research topics of 'FD-TD analysis for coaxial probe inserted into a waveguide'. Together they form a unique fingerprint.
Cite this
Sanada, A., Sanagi, M., Nogi, S., & Yamane, K. (1997). FD-TD analysis for coaxial probe inserted into a waveguide. 957-960. Paper presented at Proceedings of the 1997 Asia-Pacific Microwave Conference, APMC. Part 2 (of 3), Hong Kong, Hong Kong, .