Fault tolerance analysis of MEMS holographic memory for DORGAs

Daisaku Seto; Minoru Watanabe

doi:10.1109/MHS.2009.5352102

Fault tolerance analysis of MEMS holographic memory for DORGAs

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Demand for fast dynamic reconfiguration has increased since dynamic reconfiguration can accelerate the performance of implementation circuits on its programmable gate array. Such dynamic reconfiguration is dependent upon two important features: fast reconfiguration and numerous contexts. However, fast reconfiguration and numerous contexts share a tradeoff relation on current VLSIs. Therefore, optically recon-figurable gate arrays (ORGAs) have been developed to resolve this dilemma. Among studies of such devices, this paper presents a demonstration of a dynamic ORGA (DORGA) with a MEMS holographic memory and its fault tolerance analysis results.

Original language	English
Title of host publication	20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science
Pages	33-37
Number of pages	5
DOIs	https://doi.org/10.1109/MHS.2009.5352102
Publication status	Published - 2009
Externally published	Yes
Event	20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science - Nagoya, Japan Duration: Nov 8 2009 → Nov 11 2009

Publication series

Name	20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science

Other

Other	20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science
Country/Territory	Japan
City	Nagoya
Period	11/8/09 → 11/11/09

ASJC Scopus subject areas

Computer Science(all)
Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/MHS.2009.5352102

Cite this

Seto, D., & Watanabe, M. (2009). Fault tolerance analysis of MEMS holographic memory for DORGAs. In 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science (pp. 33-37). [5352102] (20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science). https://doi.org/10.1109/MHS.2009.5352102

Fault tolerance analysis of MEMS holographic memory for DORGAs. / Seto, Daisaku; Watanabe, Minoru.

20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science. 2009. p. 33-37 5352102 (20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Seto, D & Watanabe, M 2009, Fault tolerance analysis of MEMS holographic memory for DORGAs. in 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science., 5352102, 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science, pp. 33-37, 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science, Nagoya, Japan, 11/8/09. https://doi.org/10.1109/MHS.2009.5352102

Seto D, Watanabe M. Fault tolerance analysis of MEMS holographic memory for DORGAs. In 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science. 2009. p. 33-37. 5352102. (20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science). doi: 10.1109/MHS.2009.5352102

Seto, Daisaku ; Watanabe, Minoru. / Fault tolerance analysis of MEMS holographic memory for DORGAs. 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science. 2009. pp. 33-37 (20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science).

@inproceedings{3753c2cac75b41f7937d573225b5d63a,

title = "Fault tolerance analysis of MEMS holographic memory for DORGAs",

abstract = "Demand for fast dynamic reconfiguration has increased since dynamic reconfiguration can accelerate the performance of implementation circuits on its programmable gate array. Such dynamic reconfiguration is dependent upon two important features: fast reconfiguration and numerous contexts. However, fast reconfiguration and numerous contexts share a tradeoff relation on current VLSIs. Therefore, optically recon-figurable gate arrays (ORGAs) have been developed to resolve this dilemma. Among studies of such devices, this paper presents a demonstration of a dynamic ORGA (DORGA) with a MEMS holographic memory and its fault tolerance analysis results.",

author = "Daisaku Seto and Minoru Watanabe",

year = "2009",

doi = "10.1109/MHS.2009.5352102",

language = "English",

isbn = "9781424450954",

series = "20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science",

pages = "33--37",

booktitle = "20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science",

note = "20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science ; Conference date: 08-11-2009 Through 11-11-2009",

}

TY - GEN

T1 - Fault tolerance analysis of MEMS holographic memory for DORGAs

AU - Seto, Daisaku

AU - Watanabe, Minoru

PY - 2009

Y1 - 2009

N2 - Demand for fast dynamic reconfiguration has increased since dynamic reconfiguration can accelerate the performance of implementation circuits on its programmable gate array. Such dynamic reconfiguration is dependent upon two important features: fast reconfiguration and numerous contexts. However, fast reconfiguration and numerous contexts share a tradeoff relation on current VLSIs. Therefore, optically recon-figurable gate arrays (ORGAs) have been developed to resolve this dilemma. Among studies of such devices, this paper presents a demonstration of a dynamic ORGA (DORGA) with a MEMS holographic memory and its fault tolerance analysis results.

AB - Demand for fast dynamic reconfiguration has increased since dynamic reconfiguration can accelerate the performance of implementation circuits on its programmable gate array. Such dynamic reconfiguration is dependent upon two important features: fast reconfiguration and numerous contexts. However, fast reconfiguration and numerous contexts share a tradeoff relation on current VLSIs. Therefore, optically recon-figurable gate arrays (ORGAs) have been developed to resolve this dilemma. Among studies of such devices, this paper presents a demonstration of a dynamic ORGA (DORGA) with a MEMS holographic memory and its fault tolerance analysis results.

UR - http://www.scopus.com/inward/record.url?scp=77950940023&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=77950940023&partnerID=8YFLogxK

U2 - 10.1109/MHS.2009.5352102

DO - 10.1109/MHS.2009.5352102

M3 - Conference contribution

AN - SCOPUS:77950940023

SN - 9781424450954

T3 - 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science

SP - 33

EP - 37

BT - 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science

T2 - 20th Anniversary MHS 2009 and Micro-Nano Global COE - 2009 International Symposium on Micro-NanoMechatronics and Human Science

Y2 - 8 November 2009 through 11 November 2009

ER -

Fault tolerance analysis of MEMS holographic memory for DORGAs

Abstract

Publication series

Other

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this