Fabrication of in-plane aligned YBCO films on polycrystalline Ni tapes buffered with surface-oxidized NiO layers

Kaname Matsumoto; Seok Beom Kim; Jian Guo Wen; Izumi Hirabayashi; Tomonori Watanabe; Naoki Uno; Masaru Ikeda

doi:10.1109/77.784687

Fabrication of in-plane aligned YBCO films on polycrystalline Ni tapes buffered with surface-oxidized NiO layers

Kaname Matsumoto, Seok Beom Kim, Jian Guo Wen, Izumi Hirabayashi, Tomonori Watanabe, Naoki Uno, Masaru Ikeda

Research output: Contribution to journal › Article › peer-review

92 Citations (Scopus)

Abstract

Strongly in-plane aligned, c-axis oriented YBCO films were successfully grown on polycrystalline nickel tapes buffered with (lOO)-oriented NiO layers. The in-plane and out-of-plane alignments of the NiO layer were achieved by a surface-oxidation epitaxy (SOE) technique using a {100}<001> cube-textured nickel tape. The in-plane textures of NiO layers fabricated so far with the full width half maximum (FWHM) values of 11-13 degrees are sufficient tor the epitaxial growth of high-./; YBCO films. Pulsed laser deposited YBCO layers on the NiO/Ni tapes were not only c-axis oriented with respect to the tape surface, but also strongly in-plane aligned. The YBCO films on NiO/Ni tapes have a zero resistance Tc =87K and J_c=10⁴-10⁵A/cm² at 77K.

Original language	English
Pages (from-to)	1539-1542
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	9
Issue number	2 PART 2
DOIs	https://doi.org/10.1109/77.784687
Publication status	Published - 1999
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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Fabrication of in-plane aligned YBCO films on polycrystalline Ni tapes buffered with surface-oxidized NiO layers. / Matsumoto, Kaname; Kim, Seok Beom; Wen, Jian Guo; Hirabayashi, Izumi; Watanabe, Tomonori; Uno, Naoki; Ikeda, Masaru.

In: IEEE Transactions on Applied Superconductivity, Vol. 9, No. 2 PART 2, 1999, p. 1539-1542.

Research output: Contribution to journal › Article › peer-review

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abstract = "Strongly in-plane aligned, c-axis oriented YBCO films were successfully grown on polycrystalline nickel tapes buffered with (lOO)-oriented NiO layers. The in-plane and out-of-plane alignments of the NiO layer were achieved by a surface-oxidation epitaxy (SOE) technique using a {100}<001> cube-textured nickel tape. The in-plane textures of NiO layers fabricated so far with the full width half maximum (FWHM) values of 11-13 degrees are sufficient tor the epitaxial growth of high-./; YBCO films. Pulsed laser deposited YBCO layers on the NiO/Ni tapes were not only c-axis oriented with respect to the tape surface, but also strongly in-plane aligned. The YBCO films on NiO/Ni tapes have a zero resistance Tc =87K and Jc=104-105A/cm2 at 77K.",

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AU - Matsumoto, Kaname

AU - Kim, Seok Beom

AU - Wen, Jian Guo

AU - Hirabayashi, Izumi

AU - Watanabe, Tomonori

AU - Uno, Naoki

AU - Ikeda, Masaru

PY - 1999

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N2 - Strongly in-plane aligned, c-axis oriented YBCO films were successfully grown on polycrystalline nickel tapes buffered with (lOO)-oriented NiO layers. The in-plane and out-of-plane alignments of the NiO layer were achieved by a surface-oxidation epitaxy (SOE) technique using a {100}<001> cube-textured nickel tape. The in-plane textures of NiO layers fabricated so far with the full width half maximum (FWHM) values of 11-13 degrees are sufficient tor the epitaxial growth of high-./; YBCO films. Pulsed laser deposited YBCO layers on the NiO/Ni tapes were not only c-axis oriented with respect to the tape surface, but also strongly in-plane aligned. The YBCO films on NiO/Ni tapes have a zero resistance Tc =87K and Jc=104-105A/cm2 at 77K.

AB - Strongly in-plane aligned, c-axis oriented YBCO films were successfully grown on polycrystalline nickel tapes buffered with (lOO)-oriented NiO layers. The in-plane and out-of-plane alignments of the NiO layer were achieved by a surface-oxidation epitaxy (SOE) technique using a {100}<001> cube-textured nickel tape. The in-plane textures of NiO layers fabricated so far with the full width half maximum (FWHM) values of 11-13 degrees are sufficient tor the epitaxial growth of high-./; YBCO films. Pulsed laser deposited YBCO layers on the NiO/Ni tapes were not only c-axis oriented with respect to the tape surface, but also strongly in-plane aligned. The YBCO films on NiO/Ni tapes have a zero resistance Tc =87K and Jc=104-105A/cm2 at 77K.

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Fabrication of in-plane aligned YBCO films on polycrystalline Ni tapes buffered with surface-oxidized NiO layers

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