Expert system for X-ray stress measurement

Takaaki Sarai, Kazuo Honda, Yutaka Tanaka, Junya Kato

Research output: Contribution to journalArticle

Abstract

X-ray stress measurement is a very useful method to evaluate the residual stress in polycrystalline materials. In the practical measurements, many conditions, such as the diffraction plane and scanning method of the detector, must be determined. These conditions are totally dependent on the purpose of measurements, and it requires much technical knowledge to set the conditions properly. Thus, an expert system for X-ray stress measurement was developed in the present paper, which can be utilized to determine the measuring conditions. The residual stress of the low carbon steel was measured employing the conditions suggested by the system. The experimental results were quite satisfactory, and the residual stress was evaluated reasonably. It can be said that the present system will help users to determine the measuring conditions for the various purposes of studies.

Original languageEnglish
Pages (from-to)274-278
Number of pages5
JournalNippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A
Volume59
Issue number560
Publication statusPublished - Apr 1993
Externally publishedYes

Fingerprint

Stress measurement
Expert systems
Residual stresses
X rays
Polycrystalline materials
Low carbon steel
Diffraction
Detectors
Scanning

ASJC Scopus subject areas

  • Mechanical Engineering

Cite this

Expert system for X-ray stress measurement. / Sarai, Takaaki; Honda, Kazuo; Tanaka, Yutaka; Kato, Junya.

In: Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A, Vol. 59, No. 560, 04.1993, p. 274-278.

Research output: Contribution to journalArticle

Sarai, Takaaki ; Honda, Kazuo ; Tanaka, Yutaka ; Kato, Junya. / Expert system for X-ray stress measurement. In: Nippon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A. 1993 ; Vol. 59, No. 560. pp. 274-278.
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