Examining the linear complexity of multi-value sequence generated by power residue symbol

Hiroto Ino, Yasuyuki Nogami, Nasima Begum, Satoshi Uehara, Robert Morelos-Zaragoza, Kazuyoshi Tsuchiya

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

In our previous work, k-value pseudo random sequence generated by power residue symbol has been researched. The sequence is generated by applying a primitive polynomial over odd characteristics field, trace function, and power residue symbol. The sequence has some important features such as period, periodic autocorrelation, and linear complexity. In this paper, by applying an additional process to the previous procedure, an extended multi-value sequence is generated. Its features, such as the period, periodic autocorrelation, periodic crosscorrelation, and linear complexity are examined in this paper. According to the results, the new sequence also has some interesting features.

Original languageEnglish
Title of host publication2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781467386111
DOIs
Publication statusPublished - Jan 4 2016
Event2nd IEEE International Conference on Information Science and Security, ICISS 2015 - Seoul, Korea, Republic of
Duration: Dec 14 2015Dec 16 2015

Other

Other2nd IEEE International Conference on Information Science and Security, ICISS 2015
CountryKorea, Republic of
CitySeoul
Period12/14/1512/16/15

Fingerprint

Autocorrelation
Polynomials

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Computer Networks and Communications
  • Information Systems

Cite this

Ino, H., Nogami, Y., Begum, N., Uehara, S., Morelos-Zaragoza, R., & Tsuchiya, K. (2016). Examining the linear complexity of multi-value sequence generated by power residue symbol. In 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015 [7371002] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICISSEC.2015.7371002

Examining the linear complexity of multi-value sequence generated by power residue symbol. / Ino, Hiroto; Nogami, Yasuyuki; Begum, Nasima; Uehara, Satoshi; Morelos-Zaragoza, Robert; Tsuchiya, Kazuyoshi.

2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015. Institute of Electrical and Electronics Engineers Inc., 2016. 7371002.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Ino, H, Nogami, Y, Begum, N, Uehara, S, Morelos-Zaragoza, R & Tsuchiya, K 2016, Examining the linear complexity of multi-value sequence generated by power residue symbol. in 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015., 7371002, Institute of Electrical and Electronics Engineers Inc., 2nd IEEE International Conference on Information Science and Security, ICISS 2015, Seoul, Korea, Republic of, 12/14/15. https://doi.org/10.1109/ICISSEC.2015.7371002
Ino H, Nogami Y, Begum N, Uehara S, Morelos-Zaragoza R, Tsuchiya K. Examining the linear complexity of multi-value sequence generated by power residue symbol. In 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015. Institute of Electrical and Electronics Engineers Inc. 2016. 7371002 https://doi.org/10.1109/ICISSEC.2015.7371002
Ino, Hiroto ; Nogami, Yasuyuki ; Begum, Nasima ; Uehara, Satoshi ; Morelos-Zaragoza, Robert ; Tsuchiya, Kazuyoshi. / Examining the linear complexity of multi-value sequence generated by power residue symbol. 2015 IEEE 2nd International Conference on InformationScience and Security, ICISS 2015. Institute of Electrical and Electronics Engineers Inc., 2016.
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