EXAFS studies under high pressure by X-ray Raman scattering

N. Hiraoka, H. Fukui, Takuo Okuchi

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We discuss extended X-ray absorption fine structure (EXAFS) measurements on light element compounds under high pressure. An absorption edge in light elements, ≤2 keV in energy, is measured by X-ray Raman scattering using 20 keV X-rays. To enhance the intensity, a large-culet, sintered polycrystalline diamond anvil cell is used, so that a scattering volume is maximized. For a pressure monitor, diffraction lines from NaCl powders compressed together with the sample are measured through an X-ray Raman spectrometer. With this set-up, we have measured EXAFS features at the oxygen K-edge in (Formula presented.) glass up to 30 GPa. As the pressure increases, the oscillation pattern drastically changes, associated with the densification of the glass.

Original languageEnglish
Pages (from-to)1-12
Number of pages12
JournalHigh Pressure Research
DOIs
Publication statusAccepted/In press - Jul 15 2016

Keywords

  • EXAFS
  • high pressure
  • X-ray Raman scattering

ASJC Scopus subject areas

  • Condensed Matter Physics

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