EXAFS studies under high pressure by X-ray Raman scattering

N. Hiraoka, H. Fukui, Takuo Okuchi

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

We discuss extended X-ray absorption fine structure (EXAFS) measurements on light element compounds under high pressure. An absorption edge in light elements, ≤2 keV in energy, is measured by X-ray Raman scattering using 20 keV X-rays. To enhance the intensity, a large-culet, sintered polycrystalline diamond anvil cell is used, so that a scattering volume is maximized. For a pressure monitor, diffraction lines from NaCl powders compressed together with the sample are measured through an X-ray Raman spectrometer. With this set-up, we have measured EXAFS features at the oxygen K-edge in (Formula presented.) glass up to 30 GPa. As the pressure increases, the oscillation pattern drastically changes, associated with the densification of the glass.

Original languageEnglish
Pages (from-to)1-12
Number of pages12
JournalHigh Pressure Research
DOIs
Publication statusAccepted/In press - Jul 15 2016

Fingerprint

fine structure
Raman spectra
light elements
x rays
glass
densification
anvils
monitors
diamonds
spectrometers
oscillations
oxygen
cells
scattering
diffraction
energy

Keywords

  • EXAFS
  • high pressure
  • X-ray Raman scattering

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

EXAFS studies under high pressure by X-ray Raman scattering. / Hiraoka, N.; Fukui, H.; Okuchi, Takuo.

In: High Pressure Research, 15.07.2016, p. 1-12.

Research output: Contribution to journalArticle

@article{5900fcef4f924e28a7c0d4fa5cc75bd9,
title = "EXAFS studies under high pressure by X-ray Raman scattering",
abstract = "We discuss extended X-ray absorption fine structure (EXAFS) measurements on light element compounds under high pressure. An absorption edge in light elements, ≤2 keV in energy, is measured by X-ray Raman scattering using 20 keV X-rays. To enhance the intensity, a large-culet, sintered polycrystalline diamond anvil cell is used, so that a scattering volume is maximized. For a pressure monitor, diffraction lines from NaCl powders compressed together with the sample are measured through an X-ray Raman spectrometer. With this set-up, we have measured EXAFS features at the oxygen K-edge in (Formula presented.) glass up to 30 GPa. As the pressure increases, the oscillation pattern drastically changes, associated with the densification of the glass.",
keywords = "EXAFS, high pressure, X-ray Raman scattering",
author = "N. Hiraoka and H. Fukui and Takuo Okuchi",
year = "2016",
month = "7",
day = "15",
doi = "10.1080/08957959.2016.1206090",
language = "English",
pages = "1--12",
journal = "High Pressure Research",
issn = "0895-7959",
publisher = "Taylor and Francis Ltd.",

}

TY - JOUR

T1 - EXAFS studies under high pressure by X-ray Raman scattering

AU - Hiraoka, N.

AU - Fukui, H.

AU - Okuchi, Takuo

PY - 2016/7/15

Y1 - 2016/7/15

N2 - We discuss extended X-ray absorption fine structure (EXAFS) measurements on light element compounds under high pressure. An absorption edge in light elements, ≤2 keV in energy, is measured by X-ray Raman scattering using 20 keV X-rays. To enhance the intensity, a large-culet, sintered polycrystalline diamond anvil cell is used, so that a scattering volume is maximized. For a pressure monitor, diffraction lines from NaCl powders compressed together with the sample are measured through an X-ray Raman spectrometer. With this set-up, we have measured EXAFS features at the oxygen K-edge in (Formula presented.) glass up to 30 GPa. As the pressure increases, the oscillation pattern drastically changes, associated with the densification of the glass.

AB - We discuss extended X-ray absorption fine structure (EXAFS) measurements on light element compounds under high pressure. An absorption edge in light elements, ≤2 keV in energy, is measured by X-ray Raman scattering using 20 keV X-rays. To enhance the intensity, a large-culet, sintered polycrystalline diamond anvil cell is used, so that a scattering volume is maximized. For a pressure monitor, diffraction lines from NaCl powders compressed together with the sample are measured through an X-ray Raman spectrometer. With this set-up, we have measured EXAFS features at the oxygen K-edge in (Formula presented.) glass up to 30 GPa. As the pressure increases, the oscillation pattern drastically changes, associated with the densification of the glass.

KW - EXAFS

KW - high pressure

KW - X-ray Raman scattering

UR - http://www.scopus.com/inward/record.url?scp=84978536081&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84978536081&partnerID=8YFLogxK

U2 - 10.1080/08957959.2016.1206090

DO - 10.1080/08957959.2016.1206090

M3 - Article

AN - SCOPUS:84978536081

SP - 1

EP - 12

JO - High Pressure Research

JF - High Pressure Research

SN - 0895-7959

ER -