Evaluation of orientation-dependent geometry of micro triangular indentation on grain of polycrystalline α-titanium

I. Shimizu, Naoya Tada, T. Ishida

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In microindentation testing, an indentation size is smaller than the average grain size of industrial polycrystalline metals, so that the indentation shape is affected by the crystallographic orientation of grain on which the indentation is imposed. Hence, clarification of the relation between the crystal orientation and the indentation shape leads to the possibility of estimating the crystal orientation by microindentation testing. In the present study, influences of crystal orientations upon indentation shapes on grains of polycrystalline titanium were investigated. The crystal orientations of grains were measured by an electron backscattered diffraction method, and indentation tests with a triangular pyramidal indenter were performed on the grains. The indentation shapes were thus observed by a laser-scanning microscope and an optical microscope. The results revealed that the direction of the most bulged position of edges from the apex of triangular indentation agreed well with an a-axis direction. It was also found that deviation of the indentation edge from the ideal one became smaller with larger angle of inclination of c-axis for the sample surface, owing to the limited slip direction of titanium. Those results suggest the possibility to evaluate the crystal orientation of titanium grain directly from the observed indentation geometry.

Original languageEnglish
Title of host publicationProceedings of SPIE - The International Society for Optical Engineering
Volume7522
DOIs
Publication statusPublished - 2010
Event4th International Conference on Experimental Mechanics - Singapore, Singapore
Duration: Nov 18 2009Nov 20 2009

Other

Other4th International Conference on Experimental Mechanics
CountrySingapore
CitySingapore
Period11/18/0911/20/09

Fingerprint

Indentation
Titanium
indentation
Triangular
titanium
Geometry
Dependent
evaluation
Evaluation
geometry
Crystal orientation
Crystal
crystals
Microscope
microhardness
Microscopes
Testing
Laser Scanning
Apex
Inclination

Keywords

  • Crystallographic orientation
  • Hexagonal close-packed structure
  • Microindentation testing
  • Polycrystalline metal
  • Titanium
  • Triangular pyramidal indentation

ASJC Scopus subject areas

  • Applied Mathematics
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Cite this

Shimizu, I., Tada, N., & Ishida, T. (2010). Evaluation of orientation-dependent geometry of micro triangular indentation on grain of polycrystalline α-titanium. In Proceedings of SPIE - The International Society for Optical Engineering (Vol. 7522). [75221Q] https://doi.org/10.1117/12.851502

Evaluation of orientation-dependent geometry of micro triangular indentation on grain of polycrystalline α-titanium. / Shimizu, I.; Tada, Naoya; Ishida, T.

Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7522 2010. 75221Q.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Shimizu, I, Tada, N & Ishida, T 2010, Evaluation of orientation-dependent geometry of micro triangular indentation on grain of polycrystalline α-titanium. in Proceedings of SPIE - The International Society for Optical Engineering. vol. 7522, 75221Q, 4th International Conference on Experimental Mechanics, Singapore, Singapore, 11/18/09. https://doi.org/10.1117/12.851502
Shimizu I, Tada N, Ishida T. Evaluation of orientation-dependent geometry of micro triangular indentation on grain of polycrystalline α-titanium. In Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7522. 2010. 75221Q https://doi.org/10.1117/12.851502
Shimizu, I. ; Tada, Naoya ; Ishida, T. / Evaluation of orientation-dependent geometry of micro triangular indentation on grain of polycrystalline α-titanium. Proceedings of SPIE - The International Society for Optical Engineering. Vol. 7522 2010.
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