Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

Masaki Hada, Jiro Matsuo

Research output: Contribution to journalConference articlepeer-review

Abstract

A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

Original languageEnglish
Article number012010
JournalIOP Conference Series: Materials Science and Engineering
Volume24
Issue number1
DOIs
Publication statusPublished - 2011
Event2010 Summer Workshop on Buried Interface Science with X-Rays and Neutrons - Nagoya, Japan
Duration: Jul 25 2010Jul 27 2010

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

Fingerprint Dive into the research topics of 'Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer'. Together they form a unique fingerprint.

Cite this