A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.
|Journal||IOP Conference Series: Materials Science and Engineering|
|Publication status||Published - Nov 22 2011|
|Event||2010 Summer Workshop on Buried Interface Science with X-Rays and Neutrons - Nagoya, Japan|
Duration: Jul 25 2010 → Jul 27 2010
ASJC Scopus subject areas
- Materials Science(all)