Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

Masaki Hada, Jiro Matsuo

Research output: Contribution to journalArticle

Abstract

A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

Original languageEnglish
Article number012010
JournalUnknown Journal
Volume24
Issue number1
DOIs
Publication statusPublished - 2011
Externally publishedYes

Fingerprint

Cadmium telluride
Diffractometers
Crystal lattices
Single crystals
X ray diffraction
X rays
Air
Acoustic wave velocity
Ultrashort pulses
Thermal effects
Infrared radiation
Crystals
cadmium telluride

ASJC Scopus subject areas

  • Materials Science(all)
  • Engineering(all)

Cite this

Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer. / Hada, Masaki; Matsuo, Jiro.

In: Unknown Journal, Vol. 24, No. 1, 012010, 2011.

Research output: Contribution to journalArticle

@article{935817ed4abf423c934f6b7ebefa3d58,
title = "Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer",
abstract = "A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4{\%}-5{\%} in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.",
author = "Masaki Hada and Jiro Matsuo",
year = "2011",
doi = "10.1088/1757-899X/24/1/012010",
language = "English",
volume = "24",
journal = "[No source information available]",
issn = "0402-1215",
number = "1",

}

TY - JOUR

T1 - Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

AU - Hada, Masaki

AU - Matsuo, Jiro

PY - 2011

Y1 - 2011

N2 - A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

AB - A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

UR - http://www.scopus.com/inward/record.url?scp=81355123412&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=81355123412&partnerID=8YFLogxK

U2 - 10.1088/1757-899X/24/1/012010

DO - 10.1088/1757-899X/24/1/012010

M3 - Article

AN - SCOPUS:81355123412

VL - 24

JO - [No source information available]

JF - [No source information available]

SN - 0402-1215

IS - 1

M1 - 012010

ER -