Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

Masaki Hada; Jiro Matsuo

doi:10.1088/1757-899X/24/1/012010

Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

Masaki Hada, Jiro Matsuo

Graduate School of Natural Science and Technology

Research output: Contribution to journal › Conference article › peer-review

Abstract

A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm² infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

Original language	English
Article number	012010
Journal	IOP Conference Series: Materials Science and Engineering
Volume	24
Issue number	1
DOIs	https://doi.org/10.1088/1757-899X/24/1/012010
Publication status	Published - 2011
Event	2010 Summer Workshop on Buried Interface Science with X-Rays and Neutrons - Nagoya, Japan Duration: Jul 25 2010 → Jul 27 2010

ASJC Scopus subject areas

Materials Science(all)
Engineering(all)

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10.1088/1757-899X/24/1/012010

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title = "Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer",

abstract = "A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.",

author = "Masaki Hada and Jiro Matsuo",

year = "2011",

doi = "10.1088/1757-899X/24/1/012010",

language = "English",

volume = "24",

journal = "IOP Conference Series: Materials Science and Engineering",

issn = "1757-8981",

publisher = "IOP Publishing Ltd.",

number = "1",

note = "2010 Summer Workshop on Buried Interface Science with X-Rays and Neutrons ; Conference date: 25-07-2010 Through 27-07-2010",

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T1 - Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

AU - Hada, Masaki

AU - Matsuo, Jiro

PY - 2011

Y1 - 2011

N2 - A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

AB - A bulk single crystal sample of cadmium telluride (CdTe) was irradiated with a ∼3 mJ/cm2 infrared femtosecond laser and analyzed with time-resolved X-ray diffraction (XRD) performed on an in-air tabletop designed for an extremely short pulsed X-ray source. The integrated intensity of Kα XRD lines from the CdTe (111) plane was decreased by 4%-5% in the time scale of ∼200 ps. The changes in integrated intensity of the XRD line were induced by the thermal effect of the CdTe lattice propagating at the acoustic velocity in the crystal.

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DO - 10.1088/1757-899X/24/1/012010

M3 - Conference article

AN - SCOPUS:81355123412

SN - 1757-8981

VL - 24

JO - IOP Conference Series: Materials Science and Engineering

JF - IOP Conference Series: Materials Science and Engineering

IS - 1

M1 - 012010

T2 - 2010 Summer Workshop on Buried Interface Science with X-Rays and Neutrons

Y2 - 25 July 2010 through 27 July 2010

ER -

Evaluation of lattice motion in CdTe single crystal using in-air tabletop time-resolved X-ray diffractometer

Abstract

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