Enhancement of dielectric constant of BaTiO3 nanoparticles studied by resonant x-ray emission spectroscopy

Nobuo Nakajima, Megumi Oki, Yoichi Isohama, Hiroshi Maruyama, Yasuhisa Tezuka, Kotaro Ishiji, Toshiaki Iwazumi, Kozo Okada

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

The nanoscopic origin of the enhancement of the dielectric constant of BaTiO3 nanoparticles was investigated by means of Ti Kβ resonant x-ray emission spectroscopy. Two inelastic peaks due to charge-transfer excitations were observed, one of which disappeared as the particle size (d) was reduced, while the other remained unchanged. This is consistent with the fact that tetragonality was also reduced with decreasing d. The origin of the large enhancement in the dielectric constant is briefly discussed from a microscopic point of view.

Original languageEnglish
Article number224114
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume86
Issue number22
DOIs
Publication statusPublished - Dec 28 2012

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Emission spectroscopy
Permittivity
permittivity
Nanoparticles
X rays
nanoparticles
augmentation
spectroscopy
Charge transfer
x rays
Particle size
charge transfer
excitation

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials

Cite this

Enhancement of dielectric constant of BaTiO3 nanoparticles studied by resonant x-ray emission spectroscopy. / Nakajima, Nobuo; Oki, Megumi; Isohama, Yoichi; Maruyama, Hiroshi; Tezuka, Yasuhisa; Ishiji, Kotaro; Iwazumi, Toshiaki; Okada, Kozo.

In: Physical Review B - Condensed Matter and Materials Physics, Vol. 86, No. 22, 224114, 28.12.2012.

Research output: Contribution to journalArticle

Nakajima, Nobuo ; Oki, Megumi ; Isohama, Yoichi ; Maruyama, Hiroshi ; Tezuka, Yasuhisa ; Ishiji, Kotaro ; Iwazumi, Toshiaki ; Okada, Kozo. / Enhancement of dielectric constant of BaTiO3 nanoparticles studied by resonant x-ray emission spectroscopy. In: Physical Review B - Condensed Matter and Materials Physics. 2012 ; Vol. 86, No. 22.
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