Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6–33 keV

Takahiko Masuda, T. Hiraki, H. Kaino, S. Kishimoto, Yuki Miyamoto, K. Okai, S. Okubo, R. Ozaki, Noboru Sasao, K. Suzuki, Satoshi Uetake, Akihiro Yoshimi, K. Yoshimura

Research output: Contribution to journalArticle

Abstract

This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.

LanguageEnglish
Pages72-77
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume913
DOIs
Publication statusPublished - Jan 1 2019

Fingerprint

Fluxes
X rays
Electric power measurement
Silicon
Avalanche photodiodes
x rays
Demonstrations
Deposits
Photons
energy
silicon
avalanches
photodiodes
converters
depletion
energy spectra
deposits
time measurement
photons
Monte Carlo simulation

Keywords

  • Avalanche photodiode
  • X-ray

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

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title = "Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6–33 keV",
abstract = "This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.",
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T1 - Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6–33 keV

AU - Masuda, Takahiko

AU - Hiraki, T.

AU - Kaino, H.

AU - Kishimoto, S.

AU - Miyamoto, Yuki

AU - Okai, K.

AU - Okubo, S.

AU - Ozaki, R.

AU - Sasao, Noboru

AU - Suzuki, K.

AU - Uetake, Satoshi

AU - Yoshimi, Akihiro

AU - Yoshimura, K.

PY - 2019/1/1

Y1 - 2019/1/1

N2 - This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.

AB - This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.

KW - Avalanche photodiode

KW - X-ray

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JF - Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

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