Energy response of X-rays under high flux conditions using a thin APD for the energy range of 6–33 keV

T. Masuda, T. Hiraki, H. Kaino, S. Kishimoto, Y. Miyamoto, K. Okai, S. Okubo, R. Ozaki, N. Sasao, K. Suzuki, S. Uetake, A. Yoshimi, K. Yoshimura

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

This paper reports on the demonstration of a high-rate energy measurement technique using a thin depletion layer silicon avalanche photodiode (Si-APD). A dedicated amplitude-to-time converter is developed to realize simultaneous energy and timing measurement in a high rate condition. The energy response of the system is systematically studied by using monochromatic X-ray beam with an incident energy ranging from 6 to 33 keV. The obtained energy spectra contain clear peaks and tail distributions. The peak fraction monotonously decreases as the incident photon energy increases. This phenomenon can be explained by considering the distribution of the energy deposit in silicon, which is investigated by using a Monte Carlo simulation.

Original languageEnglish
Pages (from-to)72-77
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume913
DOIs
Publication statusPublished - Jan 1 2019

Keywords

  • Avalanche photodiode
  • X-ray

ASJC Scopus subject areas

  • Nuclear and High Energy Physics
  • Instrumentation

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