Electronic structure of organic carrier transporting material/metal interfaces as a model interface of electroluminescent device studied by UV photoemission

K. Sugiyama, D. Yoshimura, E. Ito, T. Miyazaki, Y. Hamatani, I. Kawamoto, H. Ishii, Y. Ouchi, K. Seki

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

Electronic structures of N,N′-diphenyl-N,N′-(3-methylphenyl)-1,1′-biphenyl-4,4′- diamine (TPD) / metal and N,N′-diphenyl-1,4,5,8-naphtyltetracarboxylimide (DP-NTCI)/metal interfaces were directly investigated as a model interface of organic electroluminescent (EL) devices using UV photoemission spectroscopy (UPS). At the organic / metal interfaces, abrupt shift of vacuum level was observed, in contrast to the traditional assumption of common vacuum level at the interface. For understanding EL devices, we see the necessity of the direct observation of the interfacial electronic structure by UPS or other techniques for understanding EL devices.

Original languageEnglish
Pages (from-to)2425-2426
Number of pages2
JournalSynthetic Metals
Volume86
Issue number1-3
Publication statusPublished - Feb 28 1997
Externally publishedYes

Keywords

  • Metal/semiconductor interfaces
  • Photoelectron spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

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