Soft x-ray photoelectron spectroscopy for FeSi1-x Gex (x=0, 0.11, 0.19, 0.26, and 0.44) and FeGa3 was performed at FeL absorption edge complementary to the x-ray emission spectroscopy. The absorption and valence-band spectra show the phase transition of the electronic state between x=0.26 and 0.44 in FeSi1-x Gex accompanying the narrowing of the density of state near the Fermi edge. High-resolution x-ray absorption spectra (total electron yields) at Fe2 p3/2 absorption edge resolve the fine structure, originated from the valence and Auger component of electrons. Resonant valence-band and constant initial-state spectra show Fano-type profile at Fe2 p3/2 absorption edge only for the x=0.44 sample but not for the x=0 sample and FeGa3. The crossover point, where the Raman and Auger features mix, is near the Fe2p absorption edge for both of the x=0 and 0.44 samples, showing the delocalized 3d states.
|Journal||Physical Review B - Condensed Matter and Materials Physics|
|Publication status||Published - Jul 30 2008|
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics