Electronic properties for the C 2v and C s isomers of Pr@C 82 studied by Raman, resistivity and scanning tunneling microscopy/spectroscopy

Tomoko Hosokawa, Satoshi Fujiki, Eiji Kuwahara, Yoshihiro Kubozono, Hiroshi Kitagawa, Akihiko Fujiwara, Taishi Takenobu, Yoshihiro Iwasa

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    15 Citations (Scopus)


    Electronic properties of the major and minor isomers of Pr@C 82, I (C 2v) and II (C s), are studied by Raman scattering, resistivity measurement, scanning tunneling microscopy (STM) and scanning tunneling spectroscopy (STS). The valences of the Pr atom in both isomers are determined to be +3 based on the Raman shift in the Pr-C 82 stretching mode. The transport properties showed that both isomers are normal semiconductors with a small energy gap (E g). STM of isomer I shows internal structures dependent on bias voltage V s, and STS shows that this isomer is a semiconductor with E g = 0.7 eV.

    Original languageEnglish
    Pages (from-to)78-81
    Number of pages4
    JournalChemical Physics Letters
    Issue number1-3
    Publication statusPublished - Sep 1 2004

    ASJC Scopus subject areas

    • Physics and Astronomy(all)
    • Physical and Theoretical Chemistry


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