Electron spin resonance (ESR) analysis of Cu-doped ZnO and AlN films

Fan Yong Ran, M. Subramanian, Masaki Tanemura, Yasuhiko Hayashi, Takehiko Hihara

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Cu-doped ZnO and AlN films both exhibiting room-temperature (RT) ferromagnetism (FM) were deposited by helicon magnetron sputtering. Magnetic anisotropy was observed for all the films; saturated magnetization was larger under the applied field perpendicular to the sample surface than the in-plane field, which indicates intrinsic ferromagnetism. The easy axis of magnetization was along the [0 0 0 2] direction. Electron spin resonance (ESR) analysis showed that spins tended to align in a perpendicular direction to the surface, which might account for the observed magnetic anisotropy.

Original languageEnglish
Pages (from-to)3952-3954
Number of pages3
JournalPhysica B: Condensed Matter
Volume405
Issue number18
DOIs
Publication statusPublished - Sep 15 2010
Externally publishedYes

Keywords

  • Diluted magnetic semiconductor
  • Electron spin resonance (ESR)
  • Magnetic anisotropy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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