Electron attachment of oxygen in a drift chamber filled with xenon + 10% methane

Y. Chiba, I. Hayashibara, T. Ohsugi, T. Sakanoue, A. Taketani, N. Terunuma, Y. Suzuki, A. Tsukamoto, H. Yamamoto, Y. Fukushima, T. Kohriki, S. Nakamura, Makoto Sakuda, Y. Watase

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6 Citations (Scopus)

Abstract

The existence of O2 contamination attenuates the pulse height and degrades its resolution in a drift chamber filled with xenon-methane (90/10) gas. The first measurement of the electron attachment coefficient due to oxygen in such a mixture is reported.

Original languageEnglish
Pages (from-to)171-176
Number of pages6
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume269
Issue number1
DOIs
Publication statusPublished - Jun 1 1988
Externally publishedYes

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ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics
  • Engineering(all)

Cite this

Chiba, Y., Hayashibara, I., Ohsugi, T., Sakanoue, T., Taketani, A., Terunuma, N., Suzuki, Y., Tsukamoto, A., Yamamoto, H., Fukushima, Y., Kohriki, T., Nakamura, S., Sakuda, M., & Watase, Y. (1988). Electron attachment of oxygen in a drift chamber filled with xenon + 10% methane. Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 269(1), 171-176. https://doi.org/10.1016/0168-9002(88)90875-3