Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8

S. Sakita, T. Suzuki, F. Nakamura, M. Nohara, Y. Maeno, T. Fujita

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Abstract

Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C11 - C12)/2 in single-crystalline La2 - xSrxCuO4 only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain εxx - εyy.

Original languageEnglish
Pages (from-to)216-218
Number of pages3
JournalPhysica B: Condensed Matter
Volume219-220
Issue number1-4
DOIs
Publication statusPublished - Apr 1 1996
Externally publishedYes

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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