Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8

S. Sakita, T. Suzuki, F. Nakamura, Minoru Nohara, Y. Maeno, T. Fujita

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Ultrasound measurements have revealed a remarkable lattice softening of the transverse elastic modulus (C11 - C12)/2 in single-crystalline La2 - xSrxCuO4 only around x = 1/8. Analysis of the temperature dependence of the elastic modulus indicates that in the particular range of carrier concentration there exists a narrow electronic band in the vicinity of the Fermi level which couples to the shearing strain εxx - εyy.

Original languageEnglish
Pages (from-to)216-218
Number of pages3
JournalPhysica B: Condensed Matter
Volume219-220
Issue number1-4
DOIs
Publication statusPublished - Apr 1 1996
Externally publishedYes

Fingerprint

softening
modulus of elasticity
Elastic moduli
Crystalline materials
Fermi level
shearing
Shearing
Carrier concentration
Ultrasonics
temperature dependence
electronics
Temperature

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8. / Sakita, S.; Suzuki, T.; Nakamura, F.; Nohara, Minoru; Maeno, Y.; Fujita, T.

In: Physica B: Condensed Matter, Vol. 219-220, No. 1-4, 01.04.1996, p. 216-218.

Research output: Contribution to journalArticle

Sakita, S, Suzuki, T, Nakamura, F, Nohara, M, Maeno, Y & Fujita, T 1996, 'Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8', Physica B: Condensed Matter, vol. 219-220, no. 1-4, pp. 216-218. https://doi.org/10.1016/0921-4526(95)00700-8
Sakita, S. ; Suzuki, T. ; Nakamura, F. ; Nohara, Minoru ; Maeno, Y. ; Fujita, T. / Elastic softening in single-crystalline La2 - XSrxCuO4 around x = 1/8. In: Physica B: Condensed Matter. 1996 ; Vol. 219-220, No. 1-4. pp. 216-218.
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