Effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser

Takahiro Shimose, Yasuhiro Okamoto, Masafumi Oshita, Norio Nishi, Togo Shinonaga, Akira Okada

Research output: Contribution to journalArticle

Abstract

Silver nanowire transparent conductive film is expected as a new material of transparent electrode, because of its superior flexibility and electrical conductivity with transparency at visible wavelength. It is essential to form insulation areas on the silver nanowire transparent conductive film in electronic circuit. Laser beam processing has been widely used for this application, since high efficiency and high quality removal is possible without mechanical contact. On the other hand, laser beam is an electromagnetic wave, and it has unique characteristics such as refraction and polarization. These characteristics have a great influence on laser-material interaction, especially in nanosize materials. However, laser processing characteristics and its mechanism have not yet been clarified. Therefore, polarization indicated by electric and magnetic fields was discussed in this study, and effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser with linear polarization were experimentally and numerically investigated. Removal phenomena of silver nanowire transparent conductive film by linear polarization was different from that by circular polarization. Silver nanowires arranged in the parallel direction to polarization plane were preferentially removed. In the case of crossed two silver nanowires, electromagnetic field analysis revealed that electric field intensity of silver nanowire arranged in parallel direction to polarization plane is higher than that in perpendicular direction to polarization. Therefore, silver nanowires were selectively removed depending on the polarization plane of laser beam. Electric field intensities of silver nanowire arranged in not only parallel but also perpendicular direction to polarization plane were enhanced at intersection of silver nanowires, and holes as removal marks become remarkably large at intersections of silver nanowires.

Original languageEnglish
JournalJournal of Advanced Mechanical Design, Systems and Manufacturing
Volume12
Issue number5
DOIs
Publication statusPublished - Jan 1 2018

Fingerprint

Conductive films
Pulsed lasers
Nanowires
Silver
Polarization
Laser beams
Electric fields
Circular polarization
Lasers
Processing
Refraction
Electromagnetic waves
Transparency
Electromagnetic fields
Insulation
Magnetic fields

Keywords

  • Electric field analysis
  • Polarization
  • Removal
  • Silver nanowire
  • Transparent conductive film
  • Ultrashort pulsed laser

ASJC Scopus subject areas

  • Mechanical Engineering
  • Industrial and Manufacturing Engineering

Cite this

@article{21af53c2054b4c9396acf2c75dae7f45,
title = "Effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser",
abstract = "Silver nanowire transparent conductive film is expected as a new material of transparent electrode, because of its superior flexibility and electrical conductivity with transparency at visible wavelength. It is essential to form insulation areas on the silver nanowire transparent conductive film in electronic circuit. Laser beam processing has been widely used for this application, since high efficiency and high quality removal is possible without mechanical contact. On the other hand, laser beam is an electromagnetic wave, and it has unique characteristics such as refraction and polarization. These characteristics have a great influence on laser-material interaction, especially in nanosize materials. However, laser processing characteristics and its mechanism have not yet been clarified. Therefore, polarization indicated by electric and magnetic fields was discussed in this study, and effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser with linear polarization were experimentally and numerically investigated. Removal phenomena of silver nanowire transparent conductive film by linear polarization was different from that by circular polarization. Silver nanowires arranged in the parallel direction to polarization plane were preferentially removed. In the case of crossed two silver nanowires, electromagnetic field analysis revealed that electric field intensity of silver nanowire arranged in parallel direction to polarization plane is higher than that in perpendicular direction to polarization. Therefore, silver nanowires were selectively removed depending on the polarization plane of laser beam. Electric field intensities of silver nanowire arranged in not only parallel but also perpendicular direction to polarization plane were enhanced at intersection of silver nanowires, and holes as removal marks become remarkably large at intersections of silver nanowires.",
keywords = "Electric field analysis, Polarization, Removal, Silver nanowire, Transparent conductive film, Ultrashort pulsed laser",
author = "Takahiro Shimose and Yasuhiro Okamoto and Masafumi Oshita and Norio Nishi and Togo Shinonaga and Akira Okada",
year = "2018",
month = "1",
day = "1",
doi = "10.1299/jamdsm.2018jamdsm0100",
language = "English",
volume = "12",
journal = "Journal of Advanced Mechanical Design, Systems and Manufacturing",
issn = "1881-3054",
publisher = "Japan Society of Mechanical Engineers",
number = "5",

}

TY - JOUR

T1 - Effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser

AU - Shimose, Takahiro

AU - Okamoto, Yasuhiro

AU - Oshita, Masafumi

AU - Nishi, Norio

AU - Shinonaga, Togo

AU - Okada, Akira

PY - 2018/1/1

Y1 - 2018/1/1

N2 - Silver nanowire transparent conductive film is expected as a new material of transparent electrode, because of its superior flexibility and electrical conductivity with transparency at visible wavelength. It is essential to form insulation areas on the silver nanowire transparent conductive film in electronic circuit. Laser beam processing has been widely used for this application, since high efficiency and high quality removal is possible without mechanical contact. On the other hand, laser beam is an electromagnetic wave, and it has unique characteristics such as refraction and polarization. These characteristics have a great influence on laser-material interaction, especially in nanosize materials. However, laser processing characteristics and its mechanism have not yet been clarified. Therefore, polarization indicated by electric and magnetic fields was discussed in this study, and effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser with linear polarization were experimentally and numerically investigated. Removal phenomena of silver nanowire transparent conductive film by linear polarization was different from that by circular polarization. Silver nanowires arranged in the parallel direction to polarization plane were preferentially removed. In the case of crossed two silver nanowires, electromagnetic field analysis revealed that electric field intensity of silver nanowire arranged in parallel direction to polarization plane is higher than that in perpendicular direction to polarization. Therefore, silver nanowires were selectively removed depending on the polarization plane of laser beam. Electric field intensities of silver nanowire arranged in not only parallel but also perpendicular direction to polarization plane were enhanced at intersection of silver nanowires, and holes as removal marks become remarkably large at intersections of silver nanowires.

AB - Silver nanowire transparent conductive film is expected as a new material of transparent electrode, because of its superior flexibility and electrical conductivity with transparency at visible wavelength. It is essential to form insulation areas on the silver nanowire transparent conductive film in electronic circuit. Laser beam processing has been widely used for this application, since high efficiency and high quality removal is possible without mechanical contact. On the other hand, laser beam is an electromagnetic wave, and it has unique characteristics such as refraction and polarization. These characteristics have a great influence on laser-material interaction, especially in nanosize materials. However, laser processing characteristics and its mechanism have not yet been clarified. Therefore, polarization indicated by electric and magnetic fields was discussed in this study, and effects of polarization direction on removal characteristics of silver nanowire transparent conductive film by ultrashort pulsed laser with linear polarization were experimentally and numerically investigated. Removal phenomena of silver nanowire transparent conductive film by linear polarization was different from that by circular polarization. Silver nanowires arranged in the parallel direction to polarization plane were preferentially removed. In the case of crossed two silver nanowires, electromagnetic field analysis revealed that electric field intensity of silver nanowire arranged in parallel direction to polarization plane is higher than that in perpendicular direction to polarization. Therefore, silver nanowires were selectively removed depending on the polarization plane of laser beam. Electric field intensities of silver nanowire arranged in not only parallel but also perpendicular direction to polarization plane were enhanced at intersection of silver nanowires, and holes as removal marks become remarkably large at intersections of silver nanowires.

KW - Electric field analysis

KW - Polarization

KW - Removal

KW - Silver nanowire

KW - Transparent conductive film

KW - Ultrashort pulsed laser

UR - http://www.scopus.com/inward/record.url?scp=85055844250&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85055844250&partnerID=8YFLogxK

U2 - 10.1299/jamdsm.2018jamdsm0100

DO - 10.1299/jamdsm.2018jamdsm0100

M3 - Article

AN - SCOPUS:85055844250

VL - 12

JO - Journal of Advanced Mechanical Design, Systems and Manufacturing

JF - Journal of Advanced Mechanical Design, Systems and Manufacturing

SN - 1881-3054

IS - 5

ER -