Distribution of digit patterns in multi-value sequence over the odd characteristic field

Yuta Kodera, Takeru Miyazaki, Md Al Amin Khandaker, Md Arshad Ali, Takuya Kusaka, Yasuyuki Nogami, Satoshi Uehara

Research output: Contribution to journalArticle

Abstract

The authors have proposed a multi-value sequence called an NTU sequence which is generated by a trace function and the Legendre symbol over a finite field. Most of the properties for NTU sequence such as period, linear complexity, autocorrelation, and cross-correlation have been theoretically shown in our previous work. However, the distribution of digit patterns, which is one of the most important features for security applications, has not been shown yet. In this paper, the distribution has been formulated with a theoretic proof by focusing on the number of 0's contained in the digit pattern.

Original languageEnglish
Pages (from-to)1525-1536
Number of pages12
JournalIEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences
VolumeE101A
Issue number9
DOIs
Publication statusPublished - Sep 1 2018

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Digit
Autocorrelation
Odd
Trace Function
Linear Complexity
Legendre
Cross-correlation
Galois field

Keywords

  • Distribution of digit patterns
  • Legendre symbol
  • NTU sequence
  • Trace

ASJC Scopus subject areas

  • Signal Processing
  • Computer Graphics and Computer-Aided Design
  • Electrical and Electronic Engineering
  • Applied Mathematics

Cite this

Distribution of digit patterns in multi-value sequence over the odd characteristic field. / Kodera, Yuta; Miyazaki, Takeru; Khandaker, Md Al Amin; Ali, Md Arshad; Kusaka, Takuya; Nogami, Yasuyuki; Uehara, Satoshi.

In: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences, Vol. E101A, No. 9, 01.09.2018, p. 1525-1536.

Research output: Contribution to journalArticle

Kodera, Yuta ; Miyazaki, Takeru ; Khandaker, Md Al Amin ; Ali, Md Arshad ; Kusaka, Takuya ; Nogami, Yasuyuki ; Uehara, Satoshi. / Distribution of digit patterns in multi-value sequence over the odd characteristic field. In: IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences. 2018 ; Vol. E101A, No. 9. pp. 1525-1536.
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