Distribution of bit patterns on multi-value sequence over odd characteristics field

Yuta Kodera, Takeru Miyazaki, Md Al Amin Khandaker, Ali Md Arshad, Yasuyuki Nogami, Satoshi Uehara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

The Internet of Things (IoT) provides much convenient life for us, at the same time it has brought threats for our privacy. In this context, secure and efficient cryptosystem is required to which pseudorandom sequence plays an important role. Especially, the distribution of bit patterns in the pseudorandom sequence is one of important security aspects. This paper especially focuses on the bit patterns and the distribution in an NTU sequence. As a result of a lot of observation, an important assumption about the distribution of bit patterns in an NTU sequence is introduced. It will help to obtain the balanced NTU sequence in order to enhance the security of cryptosystem on IoT communications.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages137-138
Number of pages2
ISBN (Electronic)9781509040179
DOIs
Publication statusPublished - Jul 25 2017
Event4th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017 - Taipei, United States
Duration: Jun 12 2017Jun 14 2017

Other

Other4th IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017
CountryUnited States
CityTaipei
Period6/12/176/14/17

ASJC Scopus subject areas

  • Computer Vision and Pattern Recognition
  • Computer Networks and Communications
  • Signal Processing
  • Biomedical Engineering
  • Instrumentation
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Distribution of bit patterns on multi-value sequence over odd characteristics field'. Together they form a unique fingerprint.

  • Cite this

    Kodera, Y., Miyazaki, T., Khandaker, M. A. A., Arshad, A. M., Nogami, Y., & Uehara, S. (2017). Distribution of bit patterns on multi-value sequence over odd characteristics field. In 2017 IEEE International Conference on Consumer Electronics - Taiwan, ICCE-TW 2017 (pp. 137-138). [7991033] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCE-China.2017.7991033