Direct scanning electron microscopy observation of the dispersion of transition metal ion on mesoporous silica support

Baowang Lu, Yiwen Ju, Takayuki Abe, Katsuya Kawamoto

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

A technique for analysing transition metal ion dispersion on mesoporous silica support using SEM observation was developed. In the presence of metal ion dispersion, no white point caused by metal oxide could be observed in YAGBSE, BE and COMPO mode images. By contrast, a white point could be clearly observed.

Original languageEnglish
Pages (from-to)6890-6893
Number of pages4
JournalJournal of Nanoscience and Nanotechnology
Volume17
Issue number9
DOIs
Publication statusPublished - 2017

Fingerprint

Silicon Dioxide
Electron Scanning Microscopy
Transition metals
Metal ions
metal ions
Metals
transition metals
Silica
Observation
Ions
silicon dioxide
Scanning electron microscopy
scanning electron microscopy
Oxides
metal oxides

Keywords

  • Dispersion
  • Mesoporous
  • Mesoporous silica
  • Nano NiO particle
  • SEM observation
  • Transition metal ion

ASJC Scopus subject areas

  • Bioengineering
  • Chemistry(all)
  • Biomedical Engineering
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Direct scanning electron microscopy observation of the dispersion of transition metal ion on mesoporous silica support. / Lu, Baowang; Ju, Yiwen; Abe, Takayuki; Kawamoto, Katsuya.

In: Journal of Nanoscience and Nanotechnology, Vol. 17, No. 9, 2017, p. 6890-6893.

Research output: Contribution to journalArticle

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