Diffraction study of pressure-amorphized ZrW2O8 using in situ and recovered samples

David A. Keen, Andrew L. Goodwin, Matthew G. Tucker, Joseph A. Hriljac, Thomas D. Bennett, Martin T. Dove, Annette K. Kleppe, Andrew P. Jephcoat, Michela Brunelli

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)


High-energy x-ray diffraction data from a series of amorphous ZrW 2O8 samples, recovered from a number of different pressures, have been measured and compared with similar data collected from a sample contained within a diamond anvil cell and measured in situ at high pressure. Samples at lower pressures are a mix of crystalline and amorphous phases, whereas those above 7 GPa (both recovered and in situ) appear to be completely amorphous. Although there are only very small changes in the diffraction data from the pure phase samples recovered from different pressures, larger changes are observed in situ as a function of pressure. However, the same structural model can be used to describe all data, albeit using different densities. This strongly suggests that the amorphous phase is undergoing nonreconstructive compression in this pressure range, without fundamental modification of the underlying topology.

Original languageEnglish
Article number064109
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number6
Publication statusPublished - Feb 11 2011

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

Fingerprint Dive into the research topics of 'Diffraction study of pressure-amorphized ZrW<sub>2</sub>O<sub>8</sub> using in situ and recovered samples'. Together they form a unique fingerprint.

Cite this