Dielectric properties of CaCu3Ti4O 12/CaTiO3 multilayer thin films synthesized by PLD method

Masakazu Mitsugi, Mamoru Fukunaga, Shutaro Asanuma, Yoshiaki Uesu, Wataru Kobayashi, Ichiro Terasaki

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)


In order to elucidate the origin of the characteristic dielectric response of CaCu3Ti4O12 (CCTO), we synthesize c-axis oriented multilayer thin films composed of alternative layers of CCTO and an insulator CaTiO3 (CTO) using the Pulsed Laser Deposition (PLD) method and measure the capacitance of CTO/CCTO/CTO multilayer thin films with different thicknesses of CTO and CCTO layers. After removing the extrinsic electrode/CCTO boundary effect and the CCTO/CTO interface effect, the inherent dielectric constant of CCTO is determined.

Original languageEnglish
Pages (from-to)191-195
Number of pages5
Issue number1 PART 3
Publication statusPublished - 2007
Event5th Asian Meeting on Ferroelectricity, AMF-5 - Noda, Japan
Duration: Sep 3 2006Sep 7 2006


  • CaCuTiO
  • Dielectric constant
  • Pulsed laser deposition
  • Thin films

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'Dielectric properties of CaCu<sub>3</sub>Ti<sub>4</sub>O <sub>12</sub>/CaTiO<sub>3</sub> multilayer thin films synthesized by PLD method'. Together they form a unique fingerprint.

Cite this