Development of rapid emittance measurement system

Keita Kamakura, Kichiji Hatanaka, Mitsuhiro Fukuda, Tetsuhiko Yorita, Hiroshi Ueda, Takane Saito, Shunpei Morinobu, Keiichi Nagayama, Hitoshi Tamura, Yuusuke Yasuda, Mitsuru Kibayashi, Hirofumi Yamamoto, Noriaki Hamatani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have developed a new system to measure the beam emittance [1]. With our conventional emittance measurement system, it takes about 30 minutes to get emittances in both the horizontal and vertical plane. For quick measurements, we have developed a new system consisting of a continuously driven slit with a fixed width and a BPM83 (rotating wire beam profile monitor). BPM83 uses a rotating helical wire made of tungsten, the speed is 18 rps. Continuously driven slit consists of a shielding plate with two slits, and is inserted into the beam path at an angle of 45 degrees. The slit is driven by PLC controlled stepping motor, and it takes 70 seconds to move the full stroke of 290 mm. While moving the slit, the output from BPM83 and the voltage of potentiometer that corresponds to the slit position are recorded simultaneously. We are using CAMAC for data acquisition. Trigger signals are generated by BPM83 and NIM modules. Data analysis takes about 1 second. With this system we can get the horizontal and vertical emittance plots within 75 seconds. This system will definitely make it easier to optimize parameters of ion sources and the beam transport system.

Original languageEnglish
Title of host publicationCYCLOTRONS 2013 - Proceedings of the 20th International Conference on Cyclotrons and their Applications
PublisherJoint Accelerator Conferences Website (JACoW)
Pages171-173
Number of pages3
ISBN (Electronic)9783954501281
Publication statusPublished - Mar 2014
Externally publishedYes
Event20th International Conference on Cyclotrons and their Applications, CYCLOTRONS 2013 - Vancouver, Canada
Duration: Sep 16 2013Sep 20 2013

Publication series

NameCYCLOTRONS 2013 - Proceedings of the 20th International Conference on Cyclotrons and their Applications

Conference

Conference20th International Conference on Cyclotrons and their Applications, CYCLOTRONS 2013
CountryCanada
CityVancouver
Period9/16/139/20/13

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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  • Cite this

    Kamakura, K., Hatanaka, K., Fukuda, M., Yorita, T., Ueda, H., Saito, T., Morinobu, S., Nagayama, K., Tamura, H., Yasuda, Y., Kibayashi, M., Yamamoto, H., & Hamatani, N. (2014). Development of rapid emittance measurement system. In CYCLOTRONS 2013 - Proceedings of the 20th International Conference on Cyclotrons and their Applications (pp. 171-173). (CYCLOTRONS 2013 - Proceedings of the 20th International Conference on Cyclotrons and their Applications). Joint Accelerator Conferences Website (JACoW).