Development of on-machine non-contact type aspherical measurement system

H. Suzuki, T. Kinoshita, T. Onishi, T. Moriwaki, K. Miura, T. Okino

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

A new non-contact type of on-machine measurement system with a laser probe has been developed. Subsequently, the laser probe with a B-axis rotary table was proposed to precisely measure an aspherical form with a large sweep angle. In this proposed method, the measurement probe is scanned to keep a normal angle to each measured point with different sweep angle. A trace of the measurement probe was calculated and the measurement accuracy was evaluated using a standard ball.

Original languageEnglish
Title of host publicationProceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
EditorsHendrik Van Brussel, E. Brinksmeier, H. Spaan, T. Burke
Publishereuspen
Pages325-328
Number of pages4
ISBN (Electronic)9780955308253
Publication statusPublished - Jan 1 2008
Externally publishedYes
Event10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 - Zurich, Switzerland
Duration: May 18 2008May 22 2008

Publication series

NameProceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
Volume2

Other

Other10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008
CountrySwitzerland
CityZurich
Period5/18/085/22/08

ASJC Scopus subject areas

  • Instrumentation
  • Mechanical Engineering
  • Materials Science(all)
  • Environmental Engineering
  • Industrial and Manufacturing Engineering

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  • Cite this

    Suzuki, H., Kinoshita, T., Onishi, T., Moriwaki, T., Miura, K., & Okino, T. (2008). Development of on-machine non-contact type aspherical measurement system. In H. Van Brussel, E. Brinksmeier, H. Spaan, & T. Burke (Eds.), Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008 (pp. 325-328). (Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008; Vol. 2). euspen.