Development of Lumped Element Kinetic Inductance Detectors for phonon and photon detections

Atsuko Kibayashi, Hirokazu Ishino, Yosuke Yamada, Akinori Okamoto, Yosuke Kida, Masashi Hazumi, Nobuaki Sato, Hiroki Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We present recent developments of our phonon and photon detections using Lumped Element Kinetic Inductance Detectors (LEKIDs). Photons or phonons incident on super-conducting material break Copper-pairs and change its kinetic inductance. If the superconductor is in a form of a resonator, the resonant frequency shifts depending on the deposited energy of the incident phonon or photon. We have been developing arrays of such detectors with different frequencies, and multiplex readouts in the frequency domain. We have optimized positions of resonators minimizing cross-talks between the neighboring resonators using simulation, and were able to detect phonons created in the substrate by irradiating α particles. We have also successfully counted photons incident on LEKIDs by a laser. We discuss possible future applications using LEKIDs. as well.

Original languageEnglish
Title of host publicationConference Record - IEEE Instrumentation and Measurement Technology Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1042-1045
Number of pages4
Volume2015-July
ISBN (Print)9781479961139
DOIs
Publication statusPublished - Jul 6 2015
Event2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015 - Pisa, Italy
Duration: May 11 2015May 14 2015

Other

Other2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015
CountryItaly
CityPisa
Period5/11/155/14/15

Fingerprint

Inductance
Photons
Detectors
Resonators
Kinetics
Phonons
Superconducting materials
Natural frequencies
Copper
Lasers
Substrates

Keywords

  • Kinetic inductance detectors

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Kibayashi, A., Ishino, H., Yamada, Y., Okamoto, A., Kida, Y., Hazumi, M., ... Watanabe, H. (2015). Development of Lumped Element Kinetic Inductance Detectors for phonon and photon detections. In Conference Record - IEEE Instrumentation and Measurement Technology Conference (Vol. 2015-July, pp. 1042-1045). [7151414] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/I2MTC.2015.7151414

Development of Lumped Element Kinetic Inductance Detectors for phonon and photon detections. / Kibayashi, Atsuko; Ishino, Hirokazu; Yamada, Yosuke; Okamoto, Akinori; Kida, Yosuke; Hazumi, Masashi; Sato, Nobuaki; Watanabe, Hiroki.

Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2015-July Institute of Electrical and Electronics Engineers Inc., 2015. p. 1042-1045 7151414.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Kibayashi, A, Ishino, H, Yamada, Y, Okamoto, A, Kida, Y, Hazumi, M, Sato, N & Watanabe, H 2015, Development of Lumped Element Kinetic Inductance Detectors for phonon and photon detections. in Conference Record - IEEE Instrumentation and Measurement Technology Conference. vol. 2015-July, 7151414, Institute of Electrical and Electronics Engineers Inc., pp. 1042-1045, 2015 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2015, Pisa, Italy, 5/11/15. https://doi.org/10.1109/I2MTC.2015.7151414
Kibayashi A, Ishino H, Yamada Y, Okamoto A, Kida Y, Hazumi M et al. Development of Lumped Element Kinetic Inductance Detectors for phonon and photon detections. In Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2015-July. Institute of Electrical and Electronics Engineers Inc. 2015. p. 1042-1045. 7151414 https://doi.org/10.1109/I2MTC.2015.7151414
Kibayashi, Atsuko ; Ishino, Hirokazu ; Yamada, Yosuke ; Okamoto, Akinori ; Kida, Yosuke ; Hazumi, Masashi ; Sato, Nobuaki ; Watanabe, Hiroki. / Development of Lumped Element Kinetic Inductance Detectors for phonon and photon detections. Conference Record - IEEE Instrumentation and Measurement Technology Conference. Vol. 2015-July Institute of Electrical and Electronics Engineers Inc., 2015. pp. 1042-1045
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