Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

Takayuki Muro, Yukako Kato, Tomohiro Matsushita, Toyohiko Kinoshita, Yoshio Watanabe, Hiroyuki Okazaki, Takayoshi Yokoya, Akira Sekiyama, Shigemasa Suga

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

Original languageEnglish
Pages (from-to)879-884
Number of pages6
JournalJournal of Synchrotron Radiation
Volume18
Issue number6
DOIs
Publication statusPublished - Nov 2011

Fingerprint

Photoemission
photoelectric emission
Photoelectron spectroscopy
X rays
Crystals
crystals
x rays
Electronic states
Synchrotron radiation
optical microscopes
Dispersions
spectroscopy
synchrotron radiation
Microscopes
Photons
Single crystals
single crystals
photons
electronics
excitation

Keywords

  • angle-resolved photoemission spectroscopy (ARPES)
  • microcleaving
  • micropositioning
  • small crystal
  • soft X-ray

ASJC Scopus subject areas

  • Instrumentation
  • Nuclear and High Energy Physics
  • Radiation

Cite this

Muro, T., Kato, Y., Matsushita, T., Kinoshita, T., Watanabe, Y., Okazaki, H., ... Suga, S. (2011). Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals. Journal of Synchrotron Radiation, 18(6), 879-884. https://doi.org/10.1107/S0909049511034418

Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals. / Muro, Takayuki; Kato, Yukako; Matsushita, Tomohiro; Kinoshita, Toyohiko; Watanabe, Yoshio; Okazaki, Hiroyuki; Yokoya, Takayoshi; Sekiyama, Akira; Suga, Shigemasa.

In: Journal of Synchrotron Radiation, Vol. 18, No. 6, 11.2011, p. 879-884.

Research output: Contribution to journalArticle

Muro, T, Kato, Y, Matsushita, T, Kinoshita, T, Watanabe, Y, Okazaki, H, Yokoya, T, Sekiyama, A & Suga, S 2011, 'Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals', Journal of Synchrotron Radiation, vol. 18, no. 6, pp. 879-884. https://doi.org/10.1107/S0909049511034418
Muro, Takayuki ; Kato, Yukako ; Matsushita, Tomohiro ; Kinoshita, Toyohiko ; Watanabe, Yoshio ; Okazaki, Hiroyuki ; Yokoya, Takayoshi ; Sekiyama, Akira ; Suga, Shigemasa. / Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals. In: Journal of Synchrotron Radiation. 2011 ; Vol. 18, No. 6. pp. 879-884.
@article{ee22b2af2fd44ed2abdbd5d73602fe32,
title = "Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals",
abstract = "A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.",
keywords = "angle-resolved photoemission spectroscopy (ARPES), microcleaving, micropositioning, small crystal, soft X-ray",
author = "Takayuki Muro and Yukako Kato and Tomohiro Matsushita and Toyohiko Kinoshita and Yoshio Watanabe and Hiroyuki Okazaki and Takayoshi Yokoya and Akira Sekiyama and Shigemasa Suga",
year = "2011",
month = "11",
doi = "10.1107/S0909049511034418",
language = "English",
volume = "18",
pages = "879--884",
journal = "Journal of Synchrotron Radiation",
issn = "0909-0495",
publisher = "International Union of Crystallography",
number = "6",

}

TY - JOUR

T1 - Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

AU - Muro, Takayuki

AU - Kato, Yukako

AU - Matsushita, Tomohiro

AU - Kinoshita, Toyohiko

AU - Watanabe, Yoshio

AU - Okazaki, Hiroyuki

AU - Yokoya, Takayoshi

AU - Sekiyama, Akira

AU - Suga, Shigemasa

PY - 2011/11

Y1 - 2011/11

N2 - A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

AB - A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

KW - angle-resolved photoemission spectroscopy (ARPES)

KW - microcleaving

KW - micropositioning

KW - small crystal

KW - soft X-ray

UR - http://www.scopus.com/inward/record.url?scp=80855124185&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=80855124185&partnerID=8YFLogxK

U2 - 10.1107/S0909049511034418

DO - 10.1107/S0909049511034418

M3 - Article

C2 - 21997912

AN - SCOPUS:80855124185

VL - 18

SP - 879

EP - 884

JO - Journal of Synchrotron Radiation

JF - Journal of Synchrotron Radiation

SN - 0909-0495

IS - 6

ER -