Development of a soft X-ray angle-resolved photoemission system applicable to 100 m crystals

Takayuki Muro, Yukako Kato, Tomohiro Matsushita, Toyohiko Kinoshita, Yoshio Watanabe, Hiroyuki Okazaki, Takayoshi Yokoya, Akira Sekiyama, Shigemasa Suga

Research output: Contribution to journalArticlepeer-review

7 Citations (Scopus)

Abstract

A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 m has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 μm × 65 μm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 μm × 100 μm × 80 μm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the-X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV.

Original languageEnglish
Pages (from-to)879-884
Number of pages6
JournalJournal of Synchrotron Radiation
Volume18
Issue number6
DOIs
Publication statusPublished - Nov 2011

Keywords

  • angle-resolved photoemission spectroscopy (ARPES)
  • microcleaving
  • micropositioning
  • small crystal
  • soft X-ray

ASJC Scopus subject areas

  • Radiation
  • Nuclear and High Energy Physics
  • Instrumentation

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