Abstract
We developed a compact moving-sample magnetometer that uses a high-temperature superconductor-superconducting quantum interference device (high-T c SQUID) to directly measure the flux coupled to a normal detection coil from a sample's magnetic moment in the presence of an external DC magnetic field. The moving-sample method is employed by inserting the sample between the poles of a DC electromagnet and vibrating the sample along the axis perpendicular to the external field axis using an actuator at a frequency of 2.693 Hz. First, the magnetic field of the sample is transferred by a first-order differential normal Cu coil to a SQUID for detection. Then, the SQUID output is fed to a lock-in amplifier for detection. The critical feature of the system design is the use of high-T c SQUID, which enables the realization of a compact system. The basic characteristics of the developed system are presented, and the current system exhibited a detection limit of 1 x 10 -7 emu.
| Original language | English |
|---|---|
| Pages (from-to) | 46601 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 51 |
| Issue number | 4 PART 1 |
| DOIs | |
| Publication status | Published - Apr 25 2012 |
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ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
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Development of a compact moving-sample magnetometer using high-Tc superconducting quantum interference device. / Saari, Mohd Mawardi; Sakai, Kenji; Kiwa, Toshihiko; Tsukamoto, Akira; Adachi, Seiji; Tanabe, Keiichi; Kandori, Akihiko; Tsukada, Keiji.
In: Japanese Journal of Applied Physics, Vol. 51, No. 4 PART 1, 25.04.2012, p. 46601.Research output: Contribution to journal › Article
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TY - JOUR
T1 - Development of a compact moving-sample magnetometer using high-Tc superconducting quantum interference device
AU - Saari, Mohd Mawardi
AU - Sakai, Kenji
AU - Kiwa, Toshihiko
AU - Tsukamoto, Akira
AU - Adachi, Seiji
AU - Tanabe, Keiichi
AU - Kandori, Akihiko
AU - Tsukada, Keiji
PY - 2012/4/25
Y1 - 2012/4/25
N2 - We developed a compact moving-sample magnetometer that uses a high-temperature superconductor-superconducting quantum interference device (high-T c SQUID) to directly measure the flux coupled to a normal detection coil from a sample's magnetic moment in the presence of an external DC magnetic field. The moving-sample method is employed by inserting the sample between the poles of a DC electromagnet and vibrating the sample along the axis perpendicular to the external field axis using an actuator at a frequency of 2.693 Hz. First, the magnetic field of the sample is transferred by a first-order differential normal Cu coil to a SQUID for detection. Then, the SQUID output is fed to a lock-in amplifier for detection. The critical feature of the system design is the use of high-T c SQUID, which enables the realization of a compact system. The basic characteristics of the developed system are presented, and the current system exhibited a detection limit of 1 x 10 -7 emu.
AB - We developed a compact moving-sample magnetometer that uses a high-temperature superconductor-superconducting quantum interference device (high-T c SQUID) to directly measure the flux coupled to a normal detection coil from a sample's magnetic moment in the presence of an external DC magnetic field. The moving-sample method is employed by inserting the sample between the poles of a DC electromagnet and vibrating the sample along the axis perpendicular to the external field axis using an actuator at a frequency of 2.693 Hz. First, the magnetic field of the sample is transferred by a first-order differential normal Cu coil to a SQUID for detection. Then, the SQUID output is fed to a lock-in amplifier for detection. The critical feature of the system design is the use of high-T c SQUID, which enables the realization of a compact system. The basic characteristics of the developed system are presented, and the current system exhibited a detection limit of 1 x 10 -7 emu.
UR - http://www.scopus.com/inward/record.url?scp=84860459646&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84860459646&partnerID=8YFLogxK
U2 - 10.1143/JJAP.51.046601
DO - 10.1143/JJAP.51.046601
M3 - Article
AN - SCOPUS:84860459646
VL - 51
SP - 46601
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 4 PART 1
ER -