@inproceedings{82f1ea4abe8d4ca1b03d463782af8c7c,
title = "Development and trial measurements of hard X-ray photoelectron emission microscope",
abstract = "Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.",
keywords = "Magnetic imaging, PEEM, Perpendicular recording media",
author = "T. Taniuchi and T. Wakita and M. Takagaki and N. Kawamura and M. Suzuki and T. Nakamura and K. Kobayashi and M. Kotsugi and M. Oshima and H. Akinaga and H. Muraoka and K. Ono",
year = "2007",
doi = "10.1063/1.2436315",
language = "English",
isbn = "0735403732",
series = "AIP Conference Proceedings",
pages = "1353--1356",
booktitle = "SYNCHROTRON RADIATION INSTRUMENTATION",
note = "SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation ; Conference date: 28-05-2006 Through 28-06-2006",
}