Development and trial measurements of hard X-ray photoelectron emission microscope

T. Taniuchi; T. Wakita; M. Takagaki; N. Kawamura; M. Suzuki; T. Nakamura; K. Kobayashi; M. Kotsugi; M. Oshima; H. Akinaga; H. Muraoka; K. Ono

doi:10.1063/1.2436315

Development and trial measurements of hard X-ray photoelectron emission microscope

T. Taniuchi, T. Wakita, M. Takagaki, N. Kawamura, M. Suzuki, T. Nakamura, K. Kobayashi, M. Kotsugi, M. Oshima, H. Akinaga, H. Muraoka, K. Ono

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

Original language	English
Title of host publication	SYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publication	Ninth International Conference on Synchrotron Radiation Instrumentation
Pages	1353-1356
Number of pages	4
DOIs	https://doi.org/10.1063/1.2436315
Publication status	Published - Mar 26 2007
Externally published	Yes
Event	SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of Duration: May 28 2006 → Jun 28 2006

Publication series

Name	AIP Conference Proceedings
Volume	879
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Country	Korea, Republic of
City	Daegu
Period	5/28/06 → 6/28/06

Keywords

Magnetic imaging
PEEM
Perpendicular recording media

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.2436315

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Cite this

Taniuchi, T., Wakita, T., Takagaki, M., Kawamura, N., Suzuki, M., Nakamura, T., Kobayashi, K., Kotsugi, M., Oshima, M., Akinaga, H., Muraoka, H., & Ono, K. (2007). Development and trial measurements of hard X-ray photoelectron emission microscope. In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation (pp. 1353-1356). (AIP Conference Proceedings; Vol. 879). https://doi.org/10.1063/1.2436315

Development and trial measurements of hard X-ray photoelectron emission microscope. / Taniuchi, T.; Wakita, T.; Takagaki, M.; Kawamura, N.; Suzuki, M.; Nakamura, T.; Kobayashi, K.; Kotsugi, M.; Oshima, M.; Akinaga, H.; Muraoka, H.; Ono, K.

SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. 2007. p. 1353-1356 (AIP Conference Proceedings; Vol. 879).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Taniuchi, T, Wakita, T, Takagaki, M, Kawamura, N, Suzuki, M, Nakamura, T, Kobayashi, K, Kotsugi, M, Oshima, M, Akinaga, H, Muraoka, H & Ono, K 2007, Development and trial measurements of hard X-ray photoelectron emission microscope. in SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings, vol. 879, pp. 1353-1356, SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation, Daegu, Korea, Republic of, 5/28/06. https://doi.org/10.1063/1.2436315

Taniuchi, T. ; Wakita, T. ; Takagaki, M. ; Kawamura, N. ; Suzuki, M. ; Nakamura, T. ; Kobayashi, K. ; Kotsugi, M. ; Oshima, M. ; Akinaga, H. ; Muraoka, H. ; Ono, K. / Development and trial measurements of hard X-ray photoelectron emission microscope. SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. 2007. pp. 1353-1356 (AIP Conference Proceedings).

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AU - Taniuchi, T.

AU - Wakita, T.

AU - Takagaki, M.

AU - Kawamura, N.

AU - Suzuki, M.

AU - Nakamura, T.

AU - Kobayashi, K.

AU - Kotsugi, M.

AU - Oshima, M.

AU - Akinaga, H.

AU - Muraoka, H.

AU - Ono, K.

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AB - Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

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KW - Perpendicular recording media

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