Development and trial measurements of hard X-ray photoelectron emission microscope

T. Taniuchi, T. Wakita, M. Takagaki, N. Kawamura, M. Suzuki, T. Nakamura, K. Kobayashi, M. Kotsugi, M. Oshima, H. Akinaga, H. Muraoka, K. Ono

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

Original languageEnglish
Title of host publicationSYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publicationNinth International Conference on Synchrotron Radiation Instrumentation
Pages1353-1356
Number of pages4
DOIs
Publication statusPublished - Mar 26 2007
EventSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of
Duration: May 28 2006Jun 28 2006

Publication series

NameAIP Conference Proceedings
Volume879
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

OtherSYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
CountryKorea, Republic of
CityDaegu
Period5/28/066/28/06

Keywords

  • Magnetic imaging
  • PEEM
  • Perpendicular recording media

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Taniuchi, T., Wakita, T., Takagaki, M., Kawamura, N., Suzuki, M., Nakamura, T., Kobayashi, K., Kotsugi, M., Oshima, M., Akinaga, H., Muraoka, H., & Ono, K. (2007). Development and trial measurements of hard X-ray photoelectron emission microscope. In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation (pp. 1353-1356). (AIP Conference Proceedings; Vol. 879). https://doi.org/10.1063/1.2436315