Development and trial measurements of hard X-ray photoelectron emission microscope

T. Taniuchi; T. Wakita; M. Takagaki; N. Kawamura; M. Suzuki; T. Nakamura; K. Kobayashi; M. Kotsugi; M. Oshima; H. Akinaga; H. Muraoka; K. Ono

doi:10.1063/1.2436315

Development and trial measurements of hard X-ray photoelectron emission microscope

T. Taniuchi, T. Wakita, M. Takagaki, N. Kawamura, M. Suzuki, T. Nakamura, K. Kobayashi, M. Kotsugi, M. Oshima, H. Akinaga, H. Muraoka, K. Ono

Research Institute for Interdisciplinary Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

Original language	English
Title of host publication	SYNCHROTRON RADIATION INSTRUMENTATION
Subtitle of host publication	Ninth International Conference on Synchrotron Radiation Instrumentation
Pages	1353-1356
Number of pages	4
DOIs	https://doi.org/10.1063/1.2436315
Publication status	Published - Mar 26 2007
Event	SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation - Daegu, Korea, Republic of Duration: May 28 2006 → Jun 28 2006

Publication series

Name	AIP Conference Proceedings
Volume	879
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Other

Other	SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation
Country	Korea, Republic of
City	Daegu
Period	5/28/06 → 6/28/06

Keywords

Magnetic imaging
PEEM
Perpendicular recording media

ASJC Scopus subject areas

Physics and Astronomy(all)

Access to Document

10.1063/1.2436315

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Cite this

Taniuchi, T., Wakita, T., Takagaki, M., Kawamura, N., Suzuki, M., Nakamura, T., Kobayashi, K., Kotsugi, M., Oshima, M., Akinaga, H., Muraoka, H., & Ono, K. (2007). Development and trial measurements of hard X-ray photoelectron emission microscope. In SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation (pp. 1353-1356). (AIP Conference Proceedings; Vol. 879). https://doi.org/10.1063/1.2436315

Development and trial measurements of hard X-ray photoelectron emission microscope. / Taniuchi, T.; Wakita, T.; Takagaki, M.; Kawamura, N.; Suzuki, M.; Nakamura, T.; Kobayashi, K.; Kotsugi, M.; Oshima, M.; Akinaga, H.; Muraoka, H.; Ono, K.

SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. 2007. p. 1353-1356 (AIP Conference Proceedings; Vol. 879).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Taniuchi, T, Wakita, T, Takagaki, M, Kawamura, N, Suzuki, M, Nakamura, T, Kobayashi, K, Kotsugi, M, Oshima, M, Akinaga, H, Muraoka, H & Ono, K 2007, Development and trial measurements of hard X-ray photoelectron emission microscope. in SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. AIP Conference Proceedings, vol. 879, pp. 1353-1356, SYNCHROTRON RADIATION INSTRUMENTATION: 9th International Conference on Synchrotron Radiation Instrumentation, Daegu, Korea, Republic of, 5/28/06. https://doi.org/10.1063/1.2436315

Taniuchi, T. ; Wakita, T. ; Takagaki, M. ; Kawamura, N. ; Suzuki, M. ; Nakamura, T. ; Kobayashi, K. ; Kotsugi, M. ; Oshima, M. ; Akinaga, H. ; Muraoka, H. ; Ono, K. / Development and trial measurements of hard X-ray photoelectron emission microscope. SYNCHROTRON RADIATION INSTRUMENTATION: Ninth International Conference on Synchrotron Radiation Instrumentation. 2007. pp. 1353-1356 (AIP Conference Proceedings).

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AU - Taniuchi, T.

AU - Wakita, T.

AU - Takagaki, M.

AU - Kawamura, N.

AU - Suzuki, M.

AU - Nakamura, T.

AU - Kobayashi, K.

AU - Kotsugi, M.

AU - Oshima, M.

AU - Akinaga, H.

AU - Muraoka, H.

AU - Ono, K.

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AB - Photoelectron emission microscope (PEEM) study is performed using hard x-ray illumination. We have successfully obtained images with high spatial resolution of 40 nm with hard x-rays. Spectro-microscopy of Co micro-patterns on Si substrates, which can be applied to XAFS measurements on a minute scale by PEEM. Magnetic imaging has been demonstrated at the Pt L-edges on perpendicular magnetic recording pattern of CoCrPt alloy. These results are the first step toward a new spectroscopic microscopy and magnetic imaging in a hard x-ray region.

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KW - Perpendicular recording media

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