The trial measurement and the development of synchrotron-radiation-light- illuminated scanning tunnelling microscope (SR-STM) were discussed. The microscope was designed so as to achieve atomic resolution under noisy condition in the synchrotron radiation facility. It was found that by measuring photoexcited electron current by the STM tip together with the STM tunnelling current, Si 2p soft-x-ray absorption spectra were obtained from a small area of Si(111) surface. It was also observed that the SR-STM overcome the disadvantages of the SR-PEEM, to achieve the element-specific atomic-resolution microscope.
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