Development and trial measurement of synchrotron-radiation-light- illuminated scanning tunneling microscope

Takeshi Matsushima, Taichi Okuda, Toyoaki Eguchi, Masanori Ono, Ayumi Harasawa, Takanori Wakita, Akira Kataoka, Masayuki Hamada, Atsushi Kamoshida, Yukio Hasegawa, Toyohiko Kinoshita

Research output: Contribution to journalArticlepeer-review

24 Citations (Scopus)

Abstract

The trial measurement and the development of synchrotron-radiation-light- illuminated scanning tunnelling microscope (SR-STM) were discussed. The microscope was designed so as to achieve atomic resolution under noisy condition in the synchrotron radiation facility. It was found that by measuring photoexcited electron current by the STM tip together with the STM tunnelling current, Si 2p soft-x-ray absorption spectra were obtained from a small area of Si(111) surface. It was also observed that the SR-STM overcome the disadvantages of the SR-PEEM, to achieve the element-specific atomic-resolution microscope.

Original languageEnglish
Pages (from-to)2149-2153
Number of pages5
JournalReview of Scientific Instruments
Volume75
Issue number6
DOIs
Publication statusPublished - Jun 1 2004
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation

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