Detection of CMOS open node defects by frequency analysis

Hiroyuki Michinishi, Tokumi Yokohira, Takuji Okamoto, Toshifumi Kobayashi, Tsutomu Hondo

Research output: Contribution to journalArticle

Abstract

A method to detect open node defects that cannot be detected by the conventional IDDQ test method has previously been proposed employing a sinusoidal wave superposed on the DC supply voltage. The present paper proposes a strategy to improve the detectability of the test method by means of frequency analysis of the supply current. In this strategy, defects are detected by determining whether secondary harmonics of the sinusoidal wave exist in the supply current. The effectiveness of the method is confirmed by experiments on two CMOS NAND gate packages (SSIs).

Original languageEnglish
Pages (from-to)685-687
Number of pages3
JournalIEICE Transactions on Information and Systems
VolumeE90-D
Issue number3
DOIs
Publication statusPublished - Mar 2007

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Defects
Electric potential
Experiments

Keywords

  • Current test
  • Floating gate defect
  • Frequency analysis
  • Open node defect

ASJC Scopus subject areas

  • Information Systems
  • Computer Graphics and Computer-Aided Design
  • Software

Cite this

Detection of CMOS open node defects by frequency analysis. / Michinishi, Hiroyuki; Yokohira, Tokumi; Okamoto, Takuji; Kobayashi, Toshifumi; Hondo, Tsutomu.

In: IEICE Transactions on Information and Systems, Vol. E90-D, No. 3, 03.2007, p. 685-687.

Research output: Contribution to journalArticle

Michinishi, Hiroyuki ; Yokohira, Tokumi ; Okamoto, Takuji ; Kobayashi, Toshifumi ; Hondo, Tsutomu. / Detection of CMOS open node defects by frequency analysis. In: IEICE Transactions on Information and Systems. 2007 ; Vol. E90-D, No. 3. pp. 685-687.
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