Design of sequential sampling inspection plans with screening based on minimal lattice paths

Ikuo Arizono, Hiroshi Ohta

Research output: Contribution to journalArticle

Abstract

In this article we propose new sequential sampling inspection plans with screening indexed by LTPD and AOQL, in which the alternative of accepting or rejecting a lot is decided by the results of sequential sampling plans, based on the minimal lattice paths. It is illustrated that the average total inspection can be economized by using both of the proposed sequential sampling inspection plans, with screening indexed by LTPD and AOQL, respectively.

Original languageEnglish
Pages (from-to)991-1005
Number of pages15
JournalNaval Research Logistics
Volume41
Issue number7
Publication statusPublished - Dec 1994
Externally publishedYes

Fingerprint

Minimal Path
Sequential Sampling
Lattice Paths
Screening
Inspection
Sampling
Alternatives
Design

ASJC Scopus subject areas

  • Management Science and Operations Research

Cite this

Design of sequential sampling inspection plans with screening based on minimal lattice paths. / Arizono, Ikuo; Ohta, Hiroshi.

In: Naval Research Logistics, Vol. 41, No. 7, 12.1994, p. 991-1005.

Research output: Contribution to journalArticle

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